Condition Monitoring of an X-ray Analyzer

Helsinki University of Technology | Licentiate thesis

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Authors

Date

Department

Automaatio- ja systeemitekniikan osasto

Major/Subject

Automaation tietotekniikka

Mcode

AS-116

Language

en

Pages

71

Supervisor

Koskinen, Kari

Keywords

fault detection and isolation, FDI, condition monitoring, data-based methods, PCS, PLS, CBR, subspace identification

Permanent link to this item

https://urn.fi/URN:NBN:fi:aalto-202104145531

Collections

[lic] Teknillinen korkeakoulu / TKK

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