One-Antenna Radiation Pattern Measurement of On-Wafer Antennas in Probe Station Environment
Loading...
Access rights
openAccess
URL
Journal Title
Journal ISSN
Volume Title
A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
This publication is imported from Aalto University research portal.
View publication in the Research portal (opens in new window)
View/Open full text file from the Research portal (opens in new window)
Other link related to publication (opens in new window)
View publication in the Research portal (opens in new window)
View/Open full text file from the Research portal (opens in new window)
Other link related to publication (opens in new window)
Date
2020-03-15
Major/Subject
Mcode
Degree programme
Language
en
Pages
9
31-39
31-39
Series
Progress in Electromagnetics Research, Volume 167
Abstract
We propose and demonstrate the use of radiation pattern measurement method for on-wafer antennas for the first time that is capable of in-depth antenna characterization with limited equipment. This one-antenna method extracts gain without the need for a second antenna in the on-wafer probe station environment. A combination of reference reflector translation and rotation allows radiation pattern sampling at multiple angles enabling characterization over the relevant solid angle. Several microstrip patch antennas with varying beam directions (0˚, 20˚, and 30˚) were measured with the proposed method over 120˚ in the H-plane with good agreement between simulation and experiment. The method offers a cost-effective and time-efficient solution for probe-fed, on-wafer antenna radiation performance characterization.Description
Keywords
Other note
Citation
Zheng , J , Ala-Laurinaho , J , Taylor , Z & Räisänen , A 2020 , ' One-Antenna Radiation Pattern Measurement of On-Wafer Antennas in Probe Station Environment ' , PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER , vol. 167 , pp. 31-39 . < http://www.jpier.org/PIER/pier.php?paper=19121807 >