THz Frequency Quantification of Water Gradients in Drying Paper

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorNefedova, Irinaen_US
dc.contributor.authorSun, Qiushuoen_US
dc.contributor.authorMoradikouchi, Anisen_US
dc.contributor.authorBaggio, Mariangelaen_US
dc.contributor.authorTamminen, Aleksien_US
dc.contributor.authorAla-Laurinaho, Juhaen_US
dc.contributor.authorMacPherson, Emmaen_US
dc.contributor.authorRodilla, Helenaen_US
dc.contributor.authorStake, Janen_US
dc.contributor.authorTaylor, Zacharyen_US
dc.contributor.departmentDepartment of Electronics and Nanoengineeringen
dc.contributor.groupauthorZachary Taylor Groupen
dc.contributor.groupauthorVille Viikari Groupen
dc.contributor.organizationUniversity of Birminghamen_US
dc.contributor.organizationChalmers University of Technologyen_US
dc.contributor.organizationUniversity of Warwicken_US
dc.date.accessioned2021-05-12T06:38:27Z
dc.date.available2021-05-12T06:38:27Z
dc.date.issued2020-11-08en_US
dc.description.abstractTHz-reflection spectroscopy was used to extract time-varying water gradients in drying paper targets mounted on electrically thick dielectric substrates. The data showed a pronounced and prolonged drop below dry reflectivity when the water content that peaks at low weight (∼10%). A binomial distribution fitted to the acquired data confirms the existence of the time-varying water content gradient and suggests aqueous thin film hydration can be quantified even when the contrast between the film and backing material is low.en
dc.description.versionPeer revieweden
dc.format.extent2
dc.format.mimetypeapplication/pdfen_US
dc.identifier.citationNefedova, I, Sun, Q, Moradikouchi, A, Baggio, M, Tamminen, A, Ala-Laurinaho, J, MacPherson, E, Rodilla, H, Stake, J & Taylor, Z 2020, THz Frequency Quantification of Water Gradients in Drying Paper. in 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020., 9370572, International Conference on Infrared, Millimeter, and Terahertz Waves, IEEE, pp. 844-845, International Conference on Infrared, Millimeter, and Terahertz Waves, Buffalo, New York, United States, 08/11/2020. https://doi.org/10.1109/IRMMW-THz46771.2020.9370572en
dc.identifier.doi10.1109/IRMMW-THz46771.2020.9370572en_US
dc.identifier.isbn9781728166209
dc.identifier.issn2162-2027
dc.identifier.issn2162-2035
dc.identifier.otherPURE UUID: e561cf74-2637-480b-96f7-6c9c05c79d50en_US
dc.identifier.otherPURE ITEMURL: https://research.aalto.fi/en/publications/e561cf74-2637-480b-96f7-6c9c05c79d50en_US
dc.identifier.otherPURE FILEURL: https://research.aalto.fi/files/62680018/THz_Frequency_Quantification_of_Water_Gradients_in_Drying_Paper.pdf
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/107465
dc.identifier.urnURN:NBN:fi:aalto-202105126729
dc.language.isoenen
dc.relation.ispartofInternational Conference on Infrared, Millimeter, and Terahertz Wavesen
dc.relation.ispartofseries2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020en
dc.relation.ispartofseriespp. 844-845en
dc.relation.ispartofseriesInternational Conference on Infrared, Millimeter, and Terahertz Wavesen
dc.rightsopenAccessen
dc.titleTHz Frequency Quantification of Water Gradients in Drying Paperen
dc.typeA4 Artikkeli konferenssijulkaisussafi
dc.type.versionacceptedVersion

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