Metastable defect complexes in GaAs

Loading...
Thumbnail Image

Access rights

© 1996 American Physical Society (APS). This is the accepted version of the following article: Pöykkö, S. & Puska, M. J. & Alatalo, M. & Nieminen, Risto M. 1996. Metastable defect complexes in GaAs. Physical Review B. Volume 54, Issue 11. 7909-7916. ISSN 1550-235X (electronic). DOI: 10.1103/physrevb.54.7909, which has been published in final form at http://journals.aps.org/prb/abstract/10.1103/PhysRevB.54.7909.
Final published version

URL

Journal Title

Journal ISSN

Volume Title

School of Science | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä

Date

1996

Major/Subject

Mcode

Degree programme

Language

en

Pages

7909-7916

Series

Physical Review B, Volume 54, Issue 11

Abstract

We have studied the As-vacancy–Si-impurity and the As-vacancy–As-antisite complexes in GaAs using state-of-the-art electronic structure methods. The complexes show metastability as a function of the position of the impurity or the antisite atom similarly to the large-lattice relaxation models for the isolated DX and EL2 centers. Our findings suggest the enlargement of the family of metastable defects in GaAs, and the results enlighten the metastability mechanisms in the large-lattice relaxation model. In order to discuss the possible experimental detection of this type of metastability, we calculate the positron states and annihilation characteristics for the defect complexes.

Description

Keywords

semiconductors, electron structure

Other note

Citation

Pöykkö, S. & Puska, M. J. & Alatalo, M. & Nieminen, Risto M. 1996. Metastable defect complexes in GaAs. Physical Review B. Volume 54, Issue 11. 7909-7916. ISSN 1550-235X (electronic). DOI: 10.1103/physrevb.54.7909.