Probing optical anisotropy of nanometer-thin van der waals microcrystals by near-field imaging

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dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorHu, Deboen_US
dc.contributor.authorYang, Xiaoxiaen_US
dc.contributor.authorLi, Chien_US
dc.contributor.authorLiu, Ruinaen_US
dc.contributor.authorYao, Zihengen_US
dc.contributor.authorHu, Haien_US
dc.contributor.authorCorder, Stephanie N.Gilberten_US
dc.contributor.authorChen, Jianingen_US
dc.contributor.authorSun, Zhipeien_US
dc.contributor.authorLiu, Mengkunen_US
dc.contributor.authorDai, Qingen_US
dc.contributor.departmentDepartment of Electronics and Nanoengineeringen
dc.contributor.groupauthorZhipei Sun Groupen
dc.contributor.organizationChinese Academy of Sciencesen_US
dc.contributor.organizationStony Brook Universityen_US
dc.contributor.organizationCAS - Institute of Physicsen_US
dc.date.accessioned2018-02-09T09:53:17Z
dc.date.available2018-02-09T09:53:17Z
dc.date.issued2017-12-01en_US
dc.description.abstractMost van der Waals crystals present highly anisotropic optical responses due to their strong in-plane covalent bonding and weak out-of-plane interactions. However, the determination of the polarization-dependent dielectric constants of van der Waals crystals remains a nontrivial task, since the size and dimension of the samples are often below or close to the diffraction limit of the probe light. In this work, we apply an optical nano-imaging technique to determine the anisotropic dielectric constants in representative van der Waals crystals. Through the study of both ordinary and extraordinary waveguide modes in real space, we are able to quantitatively determine the full dielectric tensors of nanometer-thin molybdenum disulfide and hexagonal boron nitride microcrystals, the most-promising van der Waals semiconductor and dielectric. Unlike traditional reflection-based methods, our measurements are reliable below the length scale of the free-space wavelength and reveal a universal route for characterizing low-dimensional crystals with high anisotropies.en
dc.description.versionPeer revieweden
dc.format.mimetypeapplication/pdfen_US
dc.identifier.citationHu, D, Yang, X, Li, C, Liu, R, Yao, Z, Hu, H, Corder, S N G, Chen, J, Sun, Z, Liu, M & Dai, Q 2017, ' Probing optical anisotropy of nanometer-thin van der waals microcrystals by near-field imaging ', Nature Communications, vol. 8, no. 1, 1471 . https://doi.org/10.1038/s41467-017-01580-7en
dc.identifier.doi10.1038/s41467-017-01580-7en_US
dc.identifier.issn2041-1723
dc.identifier.otherPURE UUID: 0ee542d0-e8c8-4f56-a014-5a2c683b93fden_US
dc.identifier.otherPURE ITEMURL: https://research.aalto.fi/en/publications/0ee542d0-e8c8-4f56-a014-5a2c683b93fden_US
dc.identifier.otherPURE LINK: http://www.scopus.com/inward/record.url?scp=85034257856&partnerID=8YFLogxKen_US
dc.identifier.otherPURE FILEURL: https://research.aalto.fi/files/16401147/sun_naturecommunication_s41467_017_01580_7.pdfen_US
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/29734
dc.identifier.urnURN:NBN:fi:aalto-201802091230
dc.language.isoenen
dc.relation.ispartofseriesNature Communicationsen
dc.relation.ispartofseriesVolume 8, issue 1en
dc.rightsopenAccessen
dc.titleProbing optical anisotropy of nanometer-thin van der waals microcrystals by near-field imagingen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.versionpublishedVersion
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