Contact Adapting Electrode Model for Electrical Impedance Tomography

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A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä

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en

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23

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SIAM Journal on Applied Mathematics, Volume 82, issue 2, pp. 427-449

Abstract

Electrical impedance tomography is an imaging modality for extracting information on the interior structure of a physical body from boundary measurements of current and voltage. This work studies a new robust way of modeling the contact electrodes used for driving current patterns into the examined object and measuring the resulting voltages. The idea is to not define the electrodes as strict geometric objects on the measurement boundary but only to assume approximate knowledge about their whereabouts and let a boundary admittivity function determine the actual locations of the current inputs. Such an approach enables reconstructing the boundary admittivity, i.e., the locations and strengths of the contacts, at the same time and with analogous methods as the interior admittivity. The functionality of the new model is verified by two-dimensional numerical experiments based on water tank data.

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Funding Information: Received by the editors February 3, 2021; accepted for publication (in revised form) October 19, 2021; published electronically March 15, 2022. https://doi.org/10.1137/21M1396125 Funding: The work of the first author was supported by the Institut Fran\cc ais de Finlande, the Embassy of France in Finland, the French Ministry of Higher Education, Research, and Innovation, the Finnish Society of Sciences and Letters, and the Finnish Academy of Science and Letters (2019 Maupertuis program). The work of the second and third authors was supported by the Academy of Finland grant 312124. The work of the fourth author was supported by the Academy of Finland grants 314701 and 320022. Publisher Copyright: © 2022 Society for Industrial and Applied Mathematics

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Dardé, J, Hyvönen, N, Kuutela, T & Valkonen, T 2022, 'Contact Adapting Electrode Model for Electrical Impedance Tomography', SIAM Journal on Applied Mathematics, vol. 82, no. 2, pp. 427-449. https://doi.org/10.1137/21M1396125