Conoscopic interferometry of wafers for surface-acoustic wave devices
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A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
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en
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4
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Journal of Applied Physics, Volume 82, issue 8, pp. 4039-4042
Abstract
We show that in interpreting the conoscopic interference fringes, one should exercise care in employing approximate expressions which fail for certain crystal cuts. In this paper, we study 64°- and 128°-rotated Y-cut and Z-cut LiNbO3 wafers. We show that the error made in using the approximate formulae for the samples is more than 25% and that one has to use exact formulae in order to attain quantitative agreement with the experimental data.Description
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Äyräs, P, Friberg, A, Kaivola, M & Salomaa, M 1997, 'Conoscopic interferometry of wafers for surface-acoustic wave devices', Journal of Applied Physics, vol. 82, no. 8, pp. 4039-4042. https://doi.org/10.1063/1.365755