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Evidence of abnormal hot carrier thermalization at van Hove singularity of twisted bilayer graphene
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A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
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en
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7
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Science Bulletin, Volume 69, issue 16, pp. 2522-2528
Abstract
Interlayer twist evokes revolutionary changes to the optical and electronic properties of twisted bilayer graphene (TBG) for electronics, photonics and optoelectronics. Although the ground state responses in TBG have been vastly and clearly studied, the dynamic process of its photoexcited carrier states mainly remains elusive. Here, we unveil the photoexcited hot carrier dynamics in TBG by time-resolved ultrafast photoluminescence (PL) autocorrelation spectroscopy. We demonstrate the unconventional ultrafast PL emission between the van Hove singularities (VHSs) with a ∼4 times prolonged relaxation lifetime. This intriguing photoexcited carrier behavior is ascribed to the abnormal hot carrier thermalization brought by bottleneck effects at VHSs and interlayer charge distribution process. Our study on hot carrier dynamics in TBG offers new insights into the excited states and correlated physics of graphene twistronics systems.
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Publisher Copyright: © 2024
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Shang, N, Huang, C, Chen, Q, Liu, C, Yao, G, Sun, Z, Meng, S, Liu, K & Hong, H 2024, 'Evidence of abnormal hot carrier thermalization at van Hove singularity of twisted bilayer graphene', Science Bulletin, vol. 69, no. 16, pp. 2522-2528. https://doi.org/10.1016/j.scib.2024.06.019