Josephson penetration depth in coplanar junctions based on 2D materials

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorLi, Tianyien_US
dc.contributor.authorGallop, John C.en_US
dc.contributor.authorHao, Lingen_US
dc.contributor.authorRomans, Edward J.en_US
dc.contributor.departmentDepartment of Applied Physicsen_US
dc.contributor.departmentNational Physical Laboratory (NPL)en_US
dc.contributor.departmentUniversity College Londonen_US
dc.date.accessioned2020-01-02T13:55:34Z
dc.date.available2020-01-02T13:55:34Z
dc.date.embargoinfo:eu-repo/date/embargoEnd/2020-11-01en_US
dc.date.issued2019-11-07en_US
dc.description.abstractJosephson junctions and superconducting quantum interference devices with graphene or other 2D materials as the weak link between superconductors have become a hot topic of research in recent years, with respect to both fundamental physics and potential applications. We have previously reported ultrawide Josephson junctions (up to 80 μm wide) based on chemical-vapor-deposition graphene where the critical current was found to be uniformly distributed in the direction perpendicular to the current. In this paper, we demonstrate that the unusually large Josephson penetration depth λ J that this corresponds to is enabled by the unique geometric structure of Josephson junctions based on 2D materials. We derive a new expression for the Josephson penetration depth of such junctions and verify our assumptions by numerical simulations.en
dc.description.versionPeer revieweden
dc.format.extent1-7
dc.format.mimetypeapplication/pdfen_US
dc.identifier.citationLi , T , Gallop , J C , Hao , L & Romans , E J 2019 , ' Josephson penetration depth in coplanar junctions based on 2D materials ' , Journal of Applied Physics , vol. 126 , no. 17 , 173901 , pp. 1-7 . https://doi.org/10.1063/1.5124391en
dc.identifier.doi10.1063/1.5124391en_US
dc.identifier.issn0021-8979
dc.identifier.issn1089-7550
dc.identifier.otherPURE UUID: 33e94b7f-c127-452d-b1c5-14223257aabaen_US
dc.identifier.otherPURE ITEMURL: https://research.aalto.fi/en/publications/33e94b7f-c127-452d-b1c5-14223257aabaen_US
dc.identifier.otherPURE LINK: http://www.scopus.com/inward/record.url?scp=85074462107&partnerID=8YFLogxKen_US
dc.identifier.otherPURE FILEURL: https://research.aalto.fi/files/38650208/Li_Josephson.1.5124391_1.pdfen_US
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/41970
dc.identifier.urnURN:NBN:fi:aalto-202001021081
dc.language.isoenen
dc.publisherAMERICAN INSTITUTE OF PHYSICS
dc.relation.ispartofseriesJournal of Applied Physicsen
dc.relation.ispartofseriesVolume 126, issue 17en
dc.rightsopenAccessen
dc.titleJosephson penetration depth in coplanar junctions based on 2D materialsen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi

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