Millimeter-Wave Antennas on Flexible Substrates: Roll-to-Roll Reverse-Offset Printing and Probe Station-Based Characterization

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.advisorAla-Laurinaho, Juha, Dr., Aalto University, Department of Electronics and Nanoengineering, Finland
dc.contributor.authorZheng, Jianfang
dc.contributor.departmentElektroniikan ja nanotekniikan laitosfi
dc.contributor.departmentDepartment of Electronics and Nanoengineeringen
dc.contributor.schoolSähkötekniikan korkeakoulufi
dc.contributor.schoolSchool of Electrical Engineeringen
dc.contributor.supervisorRäisänen, Antti V., Prof., Aalto University, Department of Electronics and Nanoengineering, Finland
dc.contributor.supervisorTaylor, Zachary D., Prof., Aalto University, Department of Electronics and Nanoengineering, Finland
dc.date.accessioned2020-01-21T10:01:06Z
dc.date.available2020-01-21T10:01:06Z
dc.date.defence2020-02-10
dc.date.issued2020
dc.description.abstractUpcoming generations of millimeter-wave (mm-wave) communication systems present significant challenges on traditional fabrication paradigms, and the characterization of antennas in such systems. To meet the next generation mm-wave systems requirements, the antenna manufacturing must be low cost, high resolution, and suitable for mass production. Further, characterization method for these antennas must be developed that are compatible with a probe station environment. This dissertation studies roll-to-roll reverse-offset (R2R-RO) printing based fabrication of mm-wave antennas on flexible substrates and investigates the antenna radiation performance characterization methods for mm-wave probe-fed on-wafer antennas. The first part of the dissertation presents the R2R-RO printing technique and its application in the fabrication of mm-wave antennas. Printing technology offers a viable option for mass production. At mm-wave frequencies, the structure feature sizes are on the order of a few 10s of microns making fabrication with conventional printing methods unfeasible. R2R-RO printing enables the fabrication with the resolution of less than 10 µm making it sufficient for the future mm-wave electronics manufacturing. The principle of R2R-RO printing is presented, and a customized design structure is proposed to enable large-area printing. Coplanar waveguide (CPW) and microstrip patch antenna structures are designed and printed with the R2R-RO technique, and measured in a probe station environment. The results demonstrate print ink layer conductivity sufficient for mm-wave antennas. The second part of the dissertation is devoted to the systematic study of methods to quantify antenna radiation performance (gain and radiation pattern). Traditional antenna gain measurement methods require a second antenna to probe the antenna under test (AUT) which substantially increases measurement system complexity and can be impractical in a probe station measurement. The one-antenna gain measurement requires only the AUT and specular conductor plate (reflector). This reduced set of equipment enables characterization of probe-fed antennas in cluttered environments. The effect of reflector size on the measurement is studied with the physical optics (PO) method. A standard gain horn (SGH) and a microstrip patch antenna were measured by the one-antenna gain measurement method with the application of time-gating on frequency domain data. In addition, the antenna gain measurement method is extended to characterize the radiation pattern by adding a rotator to measure gain values at different angles. The radiation pattern and gain of several mm-wave antennas with different designed beam directions were measured by the proposed method in the probe station environment. Good agreement was observed between experiments and simulation.en
dc.format.extent70 + app. 46
dc.format.mimetypeapplication/pdfen
dc.identifier.isbn978-952-60-8932-4 (electronic)
dc.identifier.isbn978-952-60-8931-7 (printed)
dc.identifier.issn1799-4942 (electronic)
dc.identifier.issn1799-4934 (printed)
dc.identifier.issn1799-4934 (ISSN-L)
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/42617
dc.identifier.urnURN:ISBN:978-952-60-8932-4
dc.language.isoenen
dc.opnHimdi, Mohamed, Prof., Université de Rennes 1, France
dc.publisherAalto Universityen
dc.publisherAalto-yliopistofi
dc.relation.haspart[Publication 1]: J. Zheng, J. Ala-Laurinaho, A. Alastalo, T. Mäkelä, A. Sneck, A.V. Räisänen. Studies on applicability of reverse offset in printing millimeter-wave antennas on flexible substrates. In 2017 10th Global Symposium on Millimeter-Waves (GSMM), pp. 42–43, Hong Kong, China, May 2017. DOI: 10.1109/GSMM.2017.7970292
dc.relation.haspart[Publication 2]: J. Zheng, J. Ala-Laurinaho, A. Sneck, T. Mäkelä, A. Alastalo, A.V. Räisänen. Roll-to-roll reverse offset printing of millimeterwave transmission lines and antennas on flexible substrates. In 12th European Conference on Antennas and Propagation (EuCAP 2018), London, UK, April 2018. Full text in Acris/Aaltodoc: http://urn.fi/URN:NBN:fi:aalto-201812216716. DOI: 10.1049/cp.2018.0443
dc.relation.haspart[Publication 3]: J. Zheng, J. Ala-Laurinaho, and A.V. Räisänen. A simple method for on-wafer antenna gain measurement. In 2017 Progress in Electromagnetics Research Symposium – Spring (PIERS), pp. 1620–1624, St Petersburg, Russia, May 2017. DOI: 10.1109/PIERS.2017.8262009
dc.relation.haspart[Publication 4]: J. Ala-Laurinaho, J. Zheng, and A.V. Räisänen. One-antenna gain measurement in a probe station. In 2018 IEEE Conference on Antenna Measurements & Applications (CAMA), Västerås, Sweden, September 2018. Full text in Acris/Aaltodoc: http://urn.fi/URN:NBN:fi:aalto-201901141197. DOI: 10.1109/CAMA.2018.8530553
dc.relation.haspart[Publication 5]: J. Zheng, J. Ala-Laurinaho, and A.V. Räisänen. On the one-antenna gain measurement method in probe station environment at mm-wave frequencies. IEEE Transactions on Instrumentation and Measurement,vol. 68, no. 11, pp. 4510–4517, November 2019. Full text in Acris/Aaltodoc: http://urn.fi/URN:NBN:fi:aalto-202001021095. DOI: 10.1109/TIM.2018.2890454
dc.relation.haspart[Publication 6]: J. Zheng, J. Ala-Laurinaho, Z.D. Taylor, and A.V. Räisänen. One-antenna radiation pattern measurement of on-wafer antennas in probe station environment. Submitted to Progress In Electromagnetics Research, December 2019.
dc.relation.haspart[Errata file]: Errata of P2
dc.relation.ispartofseriesAalto University publication series DOCTORAL DISSERTATIONSen
dc.relation.ispartofseries17/2020
dc.revTitz, Diane, Prof., Université Nice Sophia Antipolis, France
dc.revHeberling, Dirk, Prof., RWTH Aachen University, Germany
dc.subject.keywordantennaen
dc.subject.keywordantenna measurementen
dc.subject.keywordgainen
dc.subject.keywordmillimeter-waveen
dc.subject.keywordprinted electronicsen
dc.subject.keywordradiation patternen
dc.subject.keywordroll-to-rollen
dc.subject.keywordreverse-offseten
dc.subject.otherElectrical engineeringen
dc.subject.otherTelecommunications engineeringen
dc.titleMillimeter-Wave Antennas on Flexible Substrates: Roll-to-Roll Reverse-Offset Printing and Probe Station-Based Characterizationen
dc.typeG5 Artikkeliväitöskirjafi
dc.type.dcmitypetexten
dc.type.ontasotDoctoral dissertation (article-based)en
dc.type.ontasotVäitöskirja (artikkeli)fi
local.aalto.acrisexportstatuschecked 2020-03-20_1918
local.aalto.archiveyes
local.aalto.formfolder2020_01_20_klo_12_23
local.aalto.infraAalto Electronics-ICT
local.aalto.infraOtaNano - Aalto Nanofab / Micronova
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