Diffusive tomography methods : special boundary conditions and characterization of inclusions

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dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorHyvönen, Nuutti 
dc.contributor.departmentDepartment of Engineering Physics and Mathematicsen
dc.contributor.departmentTeknillisen fysiikan ja matematiikan osastofi
dc.contributor.labInstitute of Mathematicsen
dc.contributor.labMatematiikan laitosfi
dc.date.accessioned2012-02-13T12:43:16Z
dc.date.available2012-02-13T12:43:16Z
dc.date.issued2004-05-14 
dc.description.abstractThis thesis presents mathematical analysis of optical and electrical impedance tomography. We introduce papers [I-III], which study these diffusive tomography methods in the situation where the examined object is contaminated with inclusions that have physical properties differing from the background.en
dc.description.versionrevieweden
dc.format.extent25, [65] 
dc.format.mimetypeapplication/pdf 
dc.identifier.isbn951-22-7086-2 
dc.identifier.issn0784-3143 
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/2408
dc.identifier.urnurn:nbn:fi:tkk-003539 
dc.language.isoenen
dc.publisherHelsinki University of Technologyen
dc.publisherTeknillinen korkeakoulufi
dc.relation.haspartHyvönen N., 2002. Analysis of optical tomography with non-scattering regions. Proceedings of the Edinburgh Mathematical Society 45, number 2, pages 257-276. 
dc.relation.haspartHyvönen N., 2004. Complete electrode model of electrical impedance tomography: approximation properties and characterization of inclusions. SIAM Journal on Applied Mathematics 64, number 3, pages 902-931. [article2.pdf] © 2004 Society for Industrial and Applied Mathematics (SIAM). By permission. 
dc.relation.haspartHyvönen N., 2004. Characterizing inclusions in optical tomography. Inverse Problems 20, number 3, pages 737-751. [article3.pdf] © 2004 Institute of Physics Publishing Ltd. By permission. 
dc.relation.ispartofseriesResearch reports / Helsinki University of Technology, Institute of Mathematics. Aen
dc.relation.ispartofseries471en
dc.subject.keywordinverse boundary value problemsen
dc.subject.keywordvariational principlesen
dc.subject.keywordoptical tomographyen
dc.subject.keywordnon-scattering regionsen
dc.subject.keywordradiative transfer equationen
dc.subject.keyworddiffusion approximationen
dc.subject.keywordelectrical impedance tomographyen
dc.subject.keywordinverse conductivity problemen
dc.subject.keywordelectrode modelsen
dc.subject.keywordinclusionsen
dc.subject.keywordfactorization methoden
dc.subject.otherMathematicsen
dc.subject.otherMedical sciencesen
dc.titleDiffusive tomography methods : special boundary conditions and characterization of inclusionsen
dc.typeG5 Artikkeliväitöskirjafi
dc.type.dcmitypetexten
dc.type.ontasotVäitöskirja (artikkeli)fi
dc.type.ontasotDoctoral dissertation (article-based)en
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local.aalto.digifolderAalto_65022

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