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Diffusive tomography methods : special boundary conditions and characterization of inclusions
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Doctoral thesis (article-based)
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en
Pages
25, [65]
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Research reports / Helsinki University of Technology, Institute of Mathematics. A, 471
Abstract
This thesis presents mathematical analysis of optical and electrical impedance tomography. We introduce papers [I-III], which study these diffusive tomography methods in the situation where the examined object is contaminated with inclusions that have physical properties differing from the background.
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Parts
- Hyvönen N., 2002. Analysis of optical tomography with non-scattering regions. Proceedings of the Edinburgh Mathematical Society 45, number 2, pages 257-276.
- Hyvönen N., 2004. Complete electrode model of electrical impedance tomography: approximation properties and characterization of inclusions. SIAM Journal on Applied Mathematics 64, number 3, pages 902-931. [article2.pdf] © 2004 Society for Industrial and Applied Mathematics (SIAM). By permission.
- Hyvönen N., 2004. Characterizing inclusions in optical tomography. Inverse Problems 20, number 3, pages 737-751. [article3.pdf] © 2004 Institute of Physics Publishing Ltd. By permission.