Microwave and millimeter-wave characterization of conductive ink film in rectangular waveguide

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorWang, Xu Chenen_US
dc.contributor.authorDíaz-Rubio, Anaen_US
dc.contributor.authorTretyakov, Sergeien_US
dc.contributor.departmentDepartment of Electronics and Nanoengineeringen_US
dc.date.accessioned2018-12-10T10:24:40Z
dc.date.available2018-12-10T10:24:40Z
dc.date.issued2017-12-19en_US
dc.description.abstractAn accurate approach to characterize the sheet impedance of thin conductive ink in rectangular waveguide is reported. This method allows retrieval of the sheet impedance without prior characterization of the supporting dielectric substrate. The ink sample is positioned between two waveguide flanges, introducing a discontinuous gap. The effect of the physical discontinuity can be removed by an additional measurement of the sample without ink layer. We have examined the extraction accuracy of the proposed method within the operating band of the waveguide, and also for various substrate thicknesses. Experimental results demonstrate the applicability of the proposed approach for sheet impedance measurements of ink films on both thin or thick (up to about quarter wavelength) substrates.en
dc.description.versionPeer revieweden
dc.format.extent4
dc.format.extent843-846
dc.format.mimetypeapplication/pdfen_US
dc.identifier.citationWang , X C , Díaz-Rubio , A & Tretyakov , S 2017 , Microwave and millimeter-wave characterization of conductive ink film in rectangular waveguide . in European Microwave Week 2017 : "A Prime Year for a Prime Event", EuMW 2017 - Conference Proceedings; 47th European Microwave Conference, EuMC 2017 . vol. 2017-January , IEEE , pp. 843-846 , European Microwave Conference , Nuremberg , Germany , 10/10/2017 . https://doi.org/10.23919/EuMC.2017.8230976en
dc.identifier.doi10.23919/EuMC.2017.8230976en_US
dc.identifier.isbn9782874870477
dc.identifier.otherPURE UUID: 9aa28d09-c8fd-46b7-bb0f-46bd57ee7826en_US
dc.identifier.otherPURE ITEMURL: https://research.aalto.fi/en/publications/9aa28d09-c8fd-46b7-bb0f-46bd57ee7826en_US
dc.identifier.otherPURE LINK: http://www.scopus.com/inward/record.url?scp=85046543863&partnerID=8YFLogxKen_US
dc.identifier.otherPURE FILEURL: https://research.aalto.fi/files/21397576/ELEC_wan_et_al_Microwave_and_Millimeter_wave_EUMA.pdfen_US
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/35172
dc.identifier.urnURN:NBN:fi:aalto-201812106187
dc.language.isoenen
dc.relation.ispartofEuropean Microwave Conferenceen
dc.relation.ispartofseriesEuropean Microwave Week 2017en
dc.relation.ispartofseriesVolume 2017-Januaryen
dc.rightsopenAccessen
dc.titleMicrowave and millimeter-wave characterization of conductive ink film in rectangular waveguideen
dc.typeConference article in proceedingsfi
dc.type.versionacceptedVersion
Files