Testaus ja IEEE 1149.1 reunaluotaus
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Journal Title
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Volume Title
Helsinki University of Technology |
Diplomityö
Checking the digitized thesis and permission for publishing
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Instructions for the author
Authors
Date
2003
Department
Major/Subject
Piiritekniikka
Mcode
S-87
Degree programme
Language
fi
Pages
66
Series
Description
Supervisor
Halonen, KariThesis advisor
Lipasti, LauriKeywords
IEEE 1149.1, IEEE 1149.1, JTAG, JTAG, testing, testaus, boundary scan, reunaluotaus, test access port, reunapyyhkäisy, TAP, testiportti, BIST, TAP, BIST