Interference-exact radiative transfer simulations: Intracavity transport effects
| dc.contributor | Aalto-yliopisto | fi |
| dc.contributor | Aalto University | en |
| dc.contributor.author | Kivisaari, Pyry | en_US |
| dc.contributor.author | Sadi, Toufik | en_US |
| dc.contributor.author | Oksanen, Jani | en_US |
| dc.contributor.department | Department of Neuroscience and Biomedical Engineering | en |
| dc.contributor.editor | Piprek, Joachim | en_US |
| dc.contributor.editor | Djurisic, Aleksandra B. | en_US |
| dc.date.accessioned | 2019-02-25T08:55:26Z | |
| dc.date.available | 2019-02-25T08:55:26Z | |
| dc.date.issued | 2018-12-07 | en_US |
| dc.description | | openaire: EC/H2020/638173/EU//iTPX | |
| dc.description.abstract | Electroluminescent (EL) cooling of semiconductors has received increasing attention in recent years. To optimize the performance of devices intended for EL cooling, special care is needed in minimizing electrical losses resulting from e.g. potential barriers, and optical losses resulting from e.g. parasitic absorption. In this work, we introduce and explore a full-device modeling tool for arbitrary planar photonic devices by coupling together the interference-exact radiative transfer equation (IFRTE) of photon transport and drift-diffusion (DD) equations of carrier transport. The IFRTE coupled with DD represents a fully self-consistent model of lossy wave optics and carrier transport, connecting emission and photon recycling with electron and hole dynamics. We deploy the model to study and optimize photon emission and absorption as well as photocarrier collection in double-diode structures for EL cooling. | en |
| dc.description.version | Peer reviewed | en |
| dc.format.extent | 2 | |
| dc.format.mimetype | application/pdf | en_US |
| dc.identifier.citation | Kivisaari, P, Sadi, T & Oksanen, J 2018, Interference-exact radiative transfer simulations : Intracavity transport effects. in J Piprek & A B Djurisic (eds), 18th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2018. vol. 2018-November, 8570222, IEEE, pp. 127-128, International Conference on Numerical Simulation of Optoelectronic Devices, Hong Kong, China, 05/11/2018. https://doi.org/10.1109/NUSOD.2018.8570222 | en |
| dc.identifier.doi | 10.1109/NUSOD.2018.8570222 | en_US |
| dc.identifier.isbn | 9781538655993 | |
| dc.identifier.other | PURE UUID: ee3ed461-00fe-4d80-b811-6af67e6f424d | en_US |
| dc.identifier.other | PURE ITEMURL: https://research.aalto.fi/en/publications/ee3ed461-00fe-4d80-b811-6af67e6f424d | en_US |
| dc.identifier.other | PURE FILEURL: https://research.aalto.fi/files/32555855/SCI_Kivisaari_Sadi_Oksanen_Interference_exact.PID5427669.pdf | |
| dc.identifier.uri | https://aaltodoc.aalto.fi/handle/123456789/36931 | |
| dc.identifier.urn | URN:NBN:fi:aalto-201902252088 | |
| dc.language.iso | en | en |
| dc.relation | info:eu-repo/grantAgreement/EC/H2020/638173/EU//iTPX | en_US |
| dc.relation.fundinginfo | Support from the Academy of Finland and the European Research Council (Horizon 2020 programme, grant agreement No 638173) is gratefully acknowledged. | |
| dc.relation.ispartof | International Conference on Numerical Simulation of Optoelectronic Devices | en |
| dc.relation.ispartofseries | 18th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2018 | en |
| dc.relation.ispartofseries | Volume 2018-November, pp. 127-128 | en |
| dc.rights | openAccess | en |
| dc.title | Interference-exact radiative transfer simulations: Intracavity transport effects | en |
| dc.type | A4 Artikkeli konferenssijulkaisussa | fi |
| dc.type.version | acceptedVersion |