Development of temperature controlled probe station with Peltier elements
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Journal Title
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Volume Title
Insinööritieteiden korkeakoulu |
Master's thesis
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Authors
Date
2023-06-12
Department
Major/Subject
Product Development
Mcode
Degree programme
Master's Programme in Mechanical Engineering (MEC)
Language
en
Pages
66+6
Series
Abstract
This thesis presents research on automating a cooling system for IV and CV measurements of semiconductor detectors. Peltier elements were used to cool down a chuck where semiconductor detector samples were placed for electrical characterization measurements. A PID-based temperature control logic was adopted to maintain the chuck temperature within its target temperature’s ±0.5◦C. A PSU was used to supply current to the Peltier elements, and water cooling was used to remove the heat they generated. The new cooling system was used for the IV and CV measurements of non-radiated n-type and p-type detectors and radiated and irradiated LGADs. From these measurements, the change in detectors’ leakage current and full depletion voltage with respect to temperature was analyzed.Description
Supervisor
Ekman, KaleviThesis advisor
Brücken, ErikKeywords
Peltier elements, semiconductor detectors, LGAD, PID, temperature control, radiation detection