Measurements of shot noise in single walled carbon nanotubes

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorWu, F.
dc.contributor.authorQueipo, P.
dc.contributor.authorTsuneta, T.
dc.contributor.authorWang, T. H.
dc.contributor.authorKauppinen, E.
dc.contributor.authorHakonen, Pertti J.
dc.contributor.departmentTeknillisen fysiikan laitosfi
dc.contributor.departmentDepartment of Applied Physicsen
dc.contributor.schoolPerustieteiden korkeakoulufi
dc.contributor.schoolSchool of Scienceen
dc.date.accessioned2015-10-17T09:01:47Z
dc.date.available2015-10-17T09:01:47Z
dc.date.issued2007
dc.description.abstractWe have measured shot noise in single walled carbon nanotubes (SWNT) at 4.2K over frequencies f = 600 – 850 MHz. Here we report results obtained on shot noise without DC bias by applying an AC modulation at ω0 and recording the noise variation at 2ω0: the Fano factor is obtained by extrapolating down to zero excitation amplitude. We also discuss the applicability of this method in samples which have strongly non‐linear IV characteristics like carbon nanotubes. The obtained results are compared with regular differential noise measurements where both DC and AC bias are employed.en
dc.description.versionPeer revieweden
dc.format.extent257-260
dc.format.mimetypeapplication/pdfen
dc.identifier.citationWu, F. & Queipo, P. & Tsuneta, T. & Wang, T. H. & Kauppinen, E. & Hakonen, Pertti J. 2007. Measurements of shot noise in single walled carbon nanotubes. 19th International Conference on Noise and Fluctuations. AIP Conference Proceedings. 922. 257-260. ISBN 978-0-7354-0432-8 (printed).en
dc.identifier.isbn978-0-7354-0432-8 (printed)
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/18177
dc.identifier.urnURN:NBN:fi:aalto-201510164764
dc.language.isoenen
dc.publisherAalto Universityen
dc.publisherAalto-yliopistofi
dc.relation.ispartof19th International Conference on Noise and Fluctuationsen
dc.relation.ispartofseriesAIP Conference Proceedingsen
dc.relation.ispartofseries922
dc.rights© 2007 AIP Publishing. Copyright of AIP Conference Proceedings is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder’s express written permission. However, users may print, download, or email articles for individual use.en
dc.rights.holderAIP Publishing
dc.subject.keywordshot noiseen
dc.subject.keywordcarbon nanotubesen
dc.subject.otherPhysicsen
dc.titleMeasurements of shot noise in single walled carbon nanotubesen
dc.typeA4 Artikkeli konferenssijulkaisussafi
dc.type.dcmitypetexten
dc.type.versionFinal published versionen

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