Role of copper in light induced minority-carrier lifetime degradation of silicon

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Copyright 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. http://scitation.aip.org/content/aip/journal/apl
Journal Title
Journal ISSN
Volume Title
School of Electrical Engineering | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
Date
2009
Major/Subject
Mcode
Degree programme
Language
en
Pages
3
Series
Applied Physics Letters, Vol. 95, Issue 15
Abstract
We investigate the impact of copper on the light induced minority-carrier lifetime degradation in various crystalline silicon materials. We demonstrate here that the presence of neither boron nor oxygen is necessary for the degradation effect. In addition, our experiments reveal that copper contamination alone can cause the light induced minority-carrier lifetime degradation.
Description
Keywords
copper contamination, crystalline silicon materials, degradation effect, minority-carrier lifetime, solar cells, light-induced degradation, LID, boron, oxygen
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Citation
Savin, Hele & Yli-Koski, Marko & Haarahiltunen, Antti. 2009. Role of copper in light induced minority-carrier lifetime degradation of silicon. Applied Physics Letters. Vol. 95, Issue 15. 0003-6951 (printed). 10.1063/1.3250161.