Experimental Validation of Scalable Electromagnetically-Modeled RIS Through Ray Tracing and Indoor Measurements

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A4 Artikkeli konferenssijulkaisussa
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Authors

Date

2025-05-21

Department

Department of Electronics and Nanoengineering

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Language

en

Pages

5

Series

EuCAP 2025 - 19th European Conference on Antennas and Propagation, pp. 1-5

Abstract

This work focuses on integrating electromagnetically consistent modeling of scalable anomalous reflectors into the design and optimization of future wireless networks. A manufactured anomalous reflector sample is utilized to validate various path loss models for reconfigurable intelligent surface (RIS)assisted links through theoretical analysis, ray tracing simulation, and measurements. A static anomalous reflector prototype is developed for testing based on a linear periodic 'supercell' design, accounting for intrinsic losses and mutual coupling of RIS unit cells, then scaled to a medium-sized square planar array. To accurately model RIS in ray tracers, the radiation patterns are imported from electromagnetic solver simulations. The measurement results agree with ray tracing simulations and validate the developed models. The proposed models and methods of RIS-link analysis are adaptable to other RISs and compatible with different ray tracers, potentially reducing the need for massive calibration measurements.

Description

Keywords

Adaptation models, Analytical models, Antenna measurements, Loss measurement, Prototypes, Ray tracing, Reconfigurable intelligent surfaces, Reflector antennas, Testing, Wireless networks

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DOI

10.23919/EuCAP63536.2025.11000057

Citation

Hao, L, Vuyyuru, S K R, Tretyakov, S A & Valkonen, R 2025, Experimental Validation of Scalable Electromagnetically-Modeled RIS Through Ray Tracing and Indoor Measurements. in EuCAP 2025 - 19th European Conference on Antennas and Propagation., 11000057, IEEE, pp. 1-5, European Conference on Antennas and Propagation, Stockholm, Sweden, 30/03/2025. https://doi.org/10.23919/EuCAP63536.2025.11000057

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https://urn.fi/URN:NBN:fi:aalto-202506044207

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[article-cris] Sähkötekniikan korkeakoulu / ELEC