Direct measurement of elastic modulus of InP nanowires with Scanning Probe Microscopy in PeakForce QNM mode

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dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorGeydt, P.
dc.contributor.authorDunaevskiy, M.
dc.contributor.authorAlekseev, P.
dc.contributor.authorKakko, J. P.
dc.contributor.authorHaggrén, T.
dc.contributor.authorLähderanta, E.
dc.contributor.authorLipsanen, H.
dc.contributor.departmentDepartment of Micro and Nanosciencesen
dc.contributor.departmentDepartment of Electronics and Nanoengineeringen
dc.contributor.departmentAalto Nanofaben
dc.contributor.groupauthorHarri Lipsanen Groupen
dc.contributor.organizationLUT University
dc.contributor.organizationSt. Petersburg National Research University of Information Technologies, Mechanics and Optics (ITMO)
dc.contributor.organizationRussian Academy of Sciences
dc.date.accessioned2017-05-03T11:42:54Z
dc.date.available2017-05-03T11:42:54Z
dc.date.issued2016-11-23
dc.description.abstractIn this manuscript, we present the study of elastic properties of InP nanowires with help of scanning probe microscope in advanced PeakForce Tapping® regime. The measuring method was developed in order to investigate the Young's modulus of these cone-shaped structures with significant accuracy. The difference in InP elasticity for wurtzite phase and zinc- blende phase was revealed. It was shown that elastic modulus of InP nanowires significantly increases from 60 GPa to more than 100 GPa when diameter of a nanowire is reduced below 50 nm. The core-shell model for InP nanowire was used for the explanation of this effect.en
dc.description.versionPeer revieweden
dc.format.extent8
dc.format.mimetypeapplication/pdf
dc.identifier.citationGeydt, P, Dunaevskiy, M, Alekseev, P, Kakko, J P, Haggrén, T, Lähderanta, E & Lipsanen, H 2016, 'Direct measurement of elastic modulus of InP nanowires with Scanning Probe Microscopy in PeakForce QNM mode', Journal of Physics: Conference Series, vol. 769, no. 1, 012029. https://doi.org/10.1088/1742-6596/769/1/012029en
dc.identifier.doi10.1088/1742-6596/769/1/012029
dc.identifier.issn1742-6588
dc.identifier.issn1742-6596
dc.identifier.otherPURE UUID: 3566364e-bd13-4fa5-a68a-2c5c64fe40e5
dc.identifier.otherPURE ITEMURL: https://research.aalto.fi/en/publications/3566364e-bd13-4fa5-a68a-2c5c64fe40e5
dc.identifier.otherPURE FILEURL: https://research.aalto.fi/files/11533679/Geydt_2016_J._Phys._Conf._Ser._769_012029.pdf
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/25355
dc.identifier.urnURN:NBN:fi:aalto-201705033756
dc.language.isoenen
dc.publisherInstitute of Physics Publishing
dc.relation.ispartofseriesJournal of Physics: Conference Seriesen
dc.relation.ispartofseriesVolume 769, issue 1en
dc.rightsopenAccessen
dc.titleDirect measurement of elastic modulus of InP nanowires with Scanning Probe Microscopy in PeakForce QNM modeen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.versionpublishedVersion

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