Timing-Error Detection Design Considerations in Subthreshold: An 8-bit Microprocessor in 65 nm CMOS

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorMäkipää, Janien_US
dc.contributor.authorTurnquist, Matthew J.en_US
dc.contributor.authorLaulainen, Erkkaen_US
dc.contributor.authorKoskinen, Laurien_US
dc.contributor.departmentDepartment of Micro and Nanosciencesen
dc.date.accessioned2017-05-11T09:07:15Z
dc.date.available2017-05-11T09:07:15Z
dc.date.issued2012en_US
dc.description.abstractThis paper presents the first known timing-error detection (TED) microprocessor able to operate in subthreshold. Since the minimum energy point (MEP) of static CMOS logic is in subthreshold, there is a strong motivation to design ultra-low-power systems that can operate in this region. However, exponential dependencies in subthreshold, require systems with either excessively large safety margins or that utilize adaptive techniques. Typically, these techniques include replica paths, sensors, or TED. Each of these methods adds system complexity, area, and energy overhead. As a run-time technique, TED is the only method that accounts for both local and global variations. The microprocessor presented in this paper utilizes adaptable error-detection sequential (EDS) circuits that can adjust to process and environmental variations. The results demonstrate the feasibility of the microprocessor, as well as energy savings up to 28%, when using the TED method in subthreshold. The microprocessor is an 8-bit core, which is compatible with a commercial microcontroller. The microprocessor is fabricated in 65 nm CMOS, uses as low as 4.35 pJ/instruction, occupies an area of 50,000 μm2, and operates down to 300 mV.en
dc.description.versionPeer revieweden
dc.format.mimetypeapplication/pdfen_US
dc.identifier.citationMäkipää, J, Turnquist, M J, Laulainen, E & Koskinen, L 2012, 'Timing-Error Detection Design Considerations in Subthreshold: An 8-bit Microprocessor in 65 nm CMOS', Journal of Low Power Electronics and Applications, vol. 2, no. 2, pp. 180-196. https://doi.org/10.3390/jlpea2020180en
dc.identifier.doi10.3390/jlpea2020180en_US
dc.identifier.otherPURE UUID: c98de971-e37b-4847-ba95-d6f204833d1een_US
dc.identifier.otherPURE ITEMURL: https://research.aalto.fi/en/publications/c98de971-e37b-4847-ba95-d6f204833d1een_US
dc.identifier.otherPURE LINK: http://www.mdpi.com/2079-9268/2/2/180en_US
dc.identifier.otherPURE FILEURL: https://research.aalto.fi/files/12712691/jlpea_02_00180_v2.pdfen_US
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/25852
dc.identifier.urnURN:NBN:fi:aalto-201705114227
dc.language.isoenen
dc.publisherMDPI AG
dc.relation.ispartofseriesJournal of Low Power Electronics and Applicationsen
dc.relation.ispartofseriesVolume 2, issue 2, pp. 180-196en
dc.rightsopenAccessen
dc.subject.keywordsubthresholden_US
dc.subject.keywordultra-low-poweren_US
dc.subject.keywordtiming-error detectionen_US
dc.subject.keywordsubthreshold source-coupled logicen_US
dc.subject.keywordSCLen_US
dc.subject.keywordweak inversionen_US
dc.subject.keyworddynamic supply voltageen_US
dc.subject.keyworddynamic voltage scalingen_US
dc.titleTiming-Error Detection Design Considerations in Subthreshold: An 8-bit Microprocessor in 65 nm CMOSen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.versionpublishedVersion

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