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Statistical modelling of bipolar transistors
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Helsinki University of Technology |
Master's thesis
Electronic archive copy is available via Aalto Thesis Database.
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S-69
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en
Pages
xi + 82 s. + liitt. 10
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Supervisor
Kuivalainen, PekkaThesis advisor
Theqvist, KristianKeywords
automatic, automaattinen, BJT, vastaamattomuus, Gummel-Poon, malliparametri, mismatch, pääkomponenttianalyysi, model parameter, tilastollinen mallintaminen, principal component analysis, transistorimittaus, process variation, transistorimalli, statistical modelling, transistor measurements, transistor model