Infrared properties of randomly oriented silver nanowires
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© 2012 AIP Publishing. This article may be downloaded for personal use only. Any other use requires prior permission of the authors and the American Institute of Physics. The following article appeared in Journal of Applied Physics, Volume 112, Issue 8 and may be found at http://scitation.aip.org/content/aip/journal/jap/112/8/10.1063/1.4759374.
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School of Science |
A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
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Date
2012
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Language
en
Pages
083503/1-6
Series
Journal of Applied Physics, Volume 112, Issue 8
Abstract
We experimentally investigated the infrared properties of a set of randomly oriented silver nanowires films deposited onto glass substrate. Infrared emission of the obtained films was characterized in the long infrared range, i.e., 8–12 μm, by observing their temperature evolution under heating regime with a focal plane array infrared camera as well as a thermocouple. The obtained experimental results showed that the infrared emission from a mesh composed of silver nanowires might be tailored by opportunely assessing preparation condition, such as the metal filling factor. From the theoretical point of view, the real and imaginary part of the electrical permittivity components were retrieved from the calculations of effective permittivities of in-plane randomly oriented metallic wires, thus giving the refractive index and extinction coefficients for the four different silver nanowires meshes. Due to the correspondence between emissivity and absorbance, the experimental results are interpreted with the reconstructed corresponding absorbance spectra, thus suggesting that these coatings are suitable for infrared signature reduction applications.Description
Keywords
silver nanowires, infrared properties
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Citation
Larciprete, M. C. & Albertoni, A. & Belardini, A. & Leahu, G. & Li Voti, R. & Mura, F. & Sibilia, C. & Nefedov, I. & Anoshkin, I. V. & Kauppinen, Esko I. & Nasibulin, Albert G. 2012. Infrared properties of randomly oriented silver nanowires. Journal of Applied Physics. Volume 112, Issue 8. 083503/1-6. ISSN 0021-8979 (printed). DOI: 10.1063/1.4759374