Experimental evidence on removing copper and light-induced degradation from silicon by negative charge

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dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorBoulfrad, Yacine
dc.contributor.authorLindroos, Jeanette
dc.contributor.authorWagner, Matthias
dc.contributor.authorWolny, Franziska
dc.contributor.authorYli-Koski, Marko
dc.contributor.authorSavin, Hele
dc.contributor.departmentDepartment of Micro and Nanosciencesen
dc.contributor.groupauthorHele Savin Groupen
dc.date.accessioned2025-10-08T07:13:45Z
dc.date.available2025-10-08T07:13:45Z
dc.date.issued2014
dc.descriptionVK: T40310
dc.description.versionPeer revieweden
dc.format.mimetypeapplication/pdf
dc.identifier.citationBoulfrad, Y, Lindroos, J, Wagner, M, Wolny, F, Yli-Koski, M & Savin, H 2014, 'Experimental evidence on removing copper and light-induced degradation from silicon by negative charge', Applied Physics Letters, vol. 105, no. 105. https://doi.org/10.1063/1.4901533en
dc.identifier.doi10.1063/1.4901533
dc.identifier.issn0003-6951
dc.identifier.issn1077-3118
dc.identifier.otherPURE UUID: 91cc8b81-9c8a-4df4-a873-5c5f648f91fa
dc.identifier.otherPURE ITEMURL: https://research.aalto.fi/en/publications/91cc8b81-9c8a-4df4-a873-5c5f648f91fa
dc.identifier.otherPURE FILEURL: https://research.aalto.fi/files/7392760/savin_experimental_evidence_2014.pdf
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/139725
dc.identifier.urnURN:NBN:fi:aalto-202510087906
dc.language.isoenen
dc.publisherAmerican Institute of Physics
dc.relation.ispartofseriesApplied Physics Lettersen
dc.relation.ispartofseriesVolume 105, issue 105en
dc.rightsopenAccessen
dc.titleExperimental evidence on removing copper and light-induced degradation from silicon by negative chargeen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.versionpublishedVersion

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