aalto1 untyped-item.component.html
Experimental evidence on removing copper and light-induced degradation from silicon by negative charge
Loading...
Access rights
openAccess
publishedVersion
URL
Journal Title
Journal ISSN
Volume Title
A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
This publication is imported from Aalto University research portal.
View publication in the Research portal (opens in new window)
View/Open full text file from the Research portal (opens in new window)
View publication in the Research portal (opens in new window)
View/Open full text file from the Research portal (opens in new window)
Unless otherwise stated, all rights belong to the author. You may download, display and print this publication for Your own personal use. Commercial use is prohibited.
Date
Department
Major/Subject
Mcode
Degree programme
Language
en
Pages
Series
Applied Physics Letters, Volume 105, issue 105
Description
VK: T40310
Keywords
Other note
Citation
Boulfrad, Y, Lindroos, J, Wagner, M, Wolny, F, Yli-Koski, M & Savin, H 2014, 'Experimental evidence on removing copper and light-induced degradation from silicon by negative charge', Applied Physics Letters, vol. 105, no. 105. https://doi.org/10.1063/1.4901533