One-antenna gain measurement in a probe station

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A4 Artikkeli konferenssijulkaisussa
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Date

2018-11-09

Department

Department of Electronics and Nanoengineering

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Language

en

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2018 IEEE Conference on Antenna Measurements and Applications, CAMA 2018

Abstract

This paper presents gain measurement results of a printed patch antenna in a probe station environment at millimeter wavelengths. The one-antenna gain measurement method relying on the use of a reflective plate and measurement of the reflection coefficient is applied. The accuracy of the measurement is improved by moving the reflective plate and thus changing its distance from the antenna. In addition, the time-gating is used in order to avoid the effect of the multiple reflections and other stray signals from near-by reflecting objects. The size requirement for the reflective plate is experimentally studied by using three different plate sizes. Also, different reflective plate distance ranges for the gain retrieval are investigated. The obtained results suggest that the distance range of 20-30 mm and reflective plate width of 30 mm are sufficient to provide accurate gain results for a patch antenna at W-band.

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Keywords

antenna measurements, millimeter-waves, on-wafer antennas, probe station

Other note

DOI

10.1109/CAMA.2018.8530553

Citation

Ala-Laurinaho, J, Zheng, J & Raisanen, A V 2018, One-antenna gain measurement in a probe station . in 2018 IEEE Conference on Antenna Measurements and Applications, CAMA 2018 ., 8530553, IEEE, IEEE International Conference on Antenna Measurements and Applications, Vasteras, Sweden, 03/09/2018 . https://doi.org/10.1109/CAMA.2018.8530553

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https://urn.fi/URN:NBN:fi:aalto-201901141197

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[article-cris] Sähkötekniikan korkeakoulu / ELEC