Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO 2 ( 110 ) surface

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorEnevoldsen, Georg H.
dc.contributor.authorPinto, Henry P.
dc.contributor.authorFoster, Adam S.
dc.contributor.authorJensen, Mona C. R.
dc.contributor.authorKühnle, Angelika
dc.contributor.authorReichling, Michael
dc.contributor.authorHofer, Werner A.
dc.contributor.authorLauritsen, Jeppe V.
dc.contributor.authorBesenbacher, Flemming
dc.contributor.departmentTeknillisen fysiikan laitosfi
dc.contributor.departmentDepartment of Applied Physicsen
dc.contributor.schoolPerustieteiden korkeakoulufi
dc.contributor.schoolSchool of Scienceen
dc.date.accessioned2015-08-10T09:01:33Z
dc.date.available2015-08-10T09:01:33Z
dc.date.issued2008
dc.description.abstractThe atomic-scale contrast in noncontact atomic force microscopy (nc-AFM) images is determined by thegeometry and exact atomic structure of the tip apex. However, the tip state is an experimentally unknown parameter, and the lack of insight into the tip apex often limits the possibilities of extracting precise quantitative and qualitative atomistic information on the surface under inspection. From an interplay between simultaneously recorded nc-AFM and scanning tunneling microscopy (STM) data, and atomistic STM simulations based on multiple scattering theory, we demonstrate how the state of the scanning probe microscopy (SPM) tip in the experiments may be determined. The analysis of a large number of experimental SPM images recorded with different tips reveals that no general correlation exists between the contrast observed in the nc-AFM and the tunneling current (It) images on TiO2(110) surface. The exact state of the SPM tip must, therefore, bedetermined for each specific case, which is normally a very difficult endeavor. However, our analysis of the AFM contrast on TiO2(110) surface allows us to considerably reduce the number of tips to be considered in a full simulation. By carefully evaluating the contrast of a handpicked library of SPM tips, we manage to determine a very accurate model of the SPM tip used in an experiment for the first time. It is envisioned that the approach presented here may eventually be used in future studies to screen for and select a SPM tip with a special functionalization prior to imaging an unknown sample, and in that way facilitate precise modeling and chemical identification of surface species.en
dc.description.versionPeer revieweden
dc.format.extent045416/1-19
dc.format.mimetypeapplication/pdfen
dc.identifier.citationEnevoldsen, Georg H. & Pinto, Henry P. & Foster, Adam S. & Jensen, Mona C. R. & Kühnle, Angelika & Reichling, Michael & Hofer, Werner A. & Lauritsen, Jeppe V. & Besenbacher, Flemming. 2008. Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO2(110) surface. Physical Review B. Volume 78, Issue 4. 045416/1-19. ISSN 1550-235X (electronic). DOI: 10.1103/physrevb.78.045416.en
dc.identifier.doi10.1103/physrevb.78.045416
dc.identifier.issn1550-235X (electronic)
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/17346
dc.identifier.urnURN:NBN:fi:aalto-201508103969
dc.language.isoenen
dc.publisherAmerican Physical Society (APS)en
dc.relation.ispartofseriesPhysical Review Ben
dc.relation.ispartofseriesVolume 78, Issue 4
dc.rights© 2008 American Physical Society (APS). This is the accepted version of the following article: Enevoldsen, Georg H. ; Pinto, Henry P. ; Foster, Adam S. ; Jensen, Mona C. R. ; Kühnle, Angelika ; Reichling, Michael ; Hofer, Werner A. ; Lauritsen, Jeppe V. ; Besenbacher, Flemming. 2008. Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO2(110) surface. Physical Review B. Volume 78, Issue 4. 045416/1-19. ISSN 1550-235X (electronic). DOI: 10.1103/physrevb.78.045416, which has been published in final form at http://journals.aps.org/prb/pdf/10.1103/PhysRevB.78.045416.en
dc.rights.holderAmerican Physical Society (APS)
dc.subject.keywordAFMen
dc.subject.keywordTiO2en
dc.subject.keywordtip statesen
dc.subject.otherPhysicsen
dc.titleDetailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO 2 ( 110 ) surfaceen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.dcmitypetexten
dc.type.versionFinal published versionen
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