Conoscopic interferometry of wafers for surface-acoustic wave devices

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorÄyräs, Pekka
dc.contributor.authorFriberg, Ari T.
dc.contributor.authorKaivola, Matti
dc.contributor.authorSalomaa, Martti M.
dc.contributor.departmentTeknillisen fysiikan laitosfi
dc.contributor.departmentDepartment of Applied Physicsen
dc.contributor.schoolPerustieteiden korkeakoulufi
dc.contributor.schoolSchool of Scienceen
dc.date.accessioned2015-04-28T09:43:48Z
dc.date.available2015-04-28T09:43:48Z
dc.date.issued1997
dc.description.abstractWe show that in interpreting the conoscopic interference fringes, one should exercise care in employing approximate expressions which fail for certain crystal cuts. In this paper, we study 64°- and 128°-rotated Y-cut and Z-cut LiNbO3 wafers. We show that the error made in using the approximate formulae for the samples is more than 25% and that one has to use exact formulae in order to attain quantitative agreement with the experimental data.en
dc.description.versionPeer revieweden
dc.format.extent4039-4042
dc.format.mimetypeapplication/pdfen
dc.identifier.citationÄyräs, Pekka & Friberg, Ari T. & Kaivola, Matti & Salomaa, Martti M.. 1997. Conoscopic interferometry of wafers for surface-acoustic wave devices. Journal of Applied Physics. Volume 82, Issue 8. 4039-4042. ISSN 1089-7550 (electronic). ISSN 0021-8979 (printed). DOI: 10.1063/1.365755.en
dc.identifier.doi10.1063/1.365755
dc.identifier.issn1089-7550 (electronic)
dc.identifier.issn0021-8979 (printed)
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/15787
dc.identifier.urnURN:NBN:fi:aalto-201504272448
dc.language.isoenen
dc.publisherAIP Publishingen
dc.relation.ispartofseriesJournal of Applied Physicsen
dc.relation.ispartofseriesVolume 82, Issue 8
dc.rights© 1997 American Intitute of Physics (AIP). This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. http://scitation.aip.org/content/aip/journal/japen
dc.rights.holderAmerican Intitute of Physics (AIP)
dc.subject.keywordSAW wafersen
dc.subject.keywordLiNbO3 waferen
dc.subject.keywordsurface-acoustic wave devicesen
dc.subject.keywordconoscopic interferometryen
dc.subject.keywordorientationen
dc.subject.keywordcrystalsen
dc.subject.keywordcrystal cutsen
dc.subject.otherPhysicsen
dc.titleConoscopic interferometry of wafers for surface-acoustic wave devicesen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.dcmitypetexten
dc.type.versionFinal published versionen
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