Conoscopic interferometry of wafers for surface-acoustic wave devices
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© 1997 American Intitute of Physics (AIP). This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. http://scitation.aip.org/content/aip/journal/jap
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School of Science |
A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
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Date
1997
Major/Subject
Mcode
Degree programme
Language
en
Pages
4039-4042
Series
Journal of Applied Physics, Volume 82, Issue 8
Abstract
We show that in interpreting the conoscopic interference fringes, one should exercise care in employing approximate expressions which fail for certain crystal cuts. In this paper, we study 64°- and 128°-rotated Y-cut and Z-cut LiNbO3 wafers. We show that the error made in using the approximate formulae for the samples is more than 25% and that one has to use exact formulae in order to attain quantitative agreement with the experimental data.Description
Keywords
SAW wafers, LiNbO3 wafer, surface-acoustic wave devices, conoscopic interferometry, orientation, crystals, crystal cuts
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Citation
Äyräs, Pekka & Friberg, Ari T. & Kaivola, Matti & Salomaa, Martti M.. 1997. Conoscopic interferometry of wafers for surface-acoustic wave devices. Journal of Applied Physics. Volume 82, Issue 8. 4039-4042. ISSN 1089-7550 (electronic). ISSN 0021-8979 (printed). DOI: 10.1063/1.365755.