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Maskless, High-Precision, Persistent, and Extreme Wetting-Contrast Patterning in an Environmental Scanning Electron Microscope
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© 2016 Wiley-Blackwell. This is the pre pint version of the following article: Liimatainen, Ville & Shah, Ali & Johansson, Leena-Sisko & Houbenov, Nikolay & Zhou, Quan. 2016. Maskless, High-Precision, Persistent, and Extreme Wetting-Contrast Patterning in an Environmental Scanning Electron Microscope. Small. 18. ISSN 1613-6810 (printed). DOI: 10.1002/smll.201503127, which has been published in final form at http://onlinelibrary.wiley.com/doi/10.1002/smll.201503127/abstract.
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School of Electrical Engineering |
A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
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en
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18
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Small
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Liimatainen, Ville & Shah, Ali & Johansson, Leena-Sisko & Houbenov, Nikolay & Zhou, Quan. 2016. Maskless, High-Precision, Persistent, and Extreme Wetting-Contrast Patterning in an Environmental Scanning Electron Microscope. Small. 18. 1613-6810 (printed). DOI: 10.1002/smll.201503127.