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Trends in the valence band electronic structures of mixed uranium oxides
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A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
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en
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4
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Chemical Communications, Volume 54, issue 70, pp. 9757-9760
Abstract
The valence band electronic structures of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, and β-UO3) have been studied using the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and computational methods. We show here that the RIXS technique and recorded U 5f-O 2p charge transfer excitations can be used to test the validity of theoretical approximations.
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Kvashnina, K O, Kowalski, P M, Butorin, S M, Leinders, G, Pakarinen, J, Bès, R, Li, H & Verwerft, M 2018, 'Trends in the valence band electronic structures of mixed uranium oxides', Chemical Communications, vol. 54, no. 70, pp. 9757-9760. https://doi.org/10.1039/c8cc05464a