Shot-Noise-Driven Escape in Hysteretic Josephson Junctions

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorPekola, J. P.
dc.contributor.authorNieminen, T. E.
dc.contributor.authorMeschke, M.
dc.contributor.authorKivioja, J. M.
dc.contributor.authorNiskanen, A. O.
dc.contributor.authorVartiainen, J. J.
dc.contributor.departmentDepartment of Applied Physicsen
dc.date.accessioned2018-05-22T14:46:20Z
dc.date.available2018-05-22T14:46:20Z
dc.date.issued2005-11-03
dc.description.abstractWe have measured the influence of shot noise on hysteretic Josephson junctions initially in the macroscopic quantum tunneling regime. The escape threshold current into the resistive state decreases monotonically with increasing average current through the scattering conductor, which is another tunnel junction. Escape is predominantly determined by excitation due to the wideband shot noise. This process is equivalent to thermal activation (TA) over the barrier at effective temperatures up to about 4 times the critical temperature of the superconductor. The presented TA model is in excellent agreement with the experimental results.en
dc.description.versionPeer revieweden
dc.format.extent4
dc.format.mimetypeapplication/pdf
dc.identifier.citationPekola, J P, Nieminen, T E, Meschke, M, Kivioja, J M, Niskanen, A O & Vartiainen, J J 2005, 'Shot-Noise-Driven Escape in Hysteretic Josephson Junctions', Physical Review Letters, vol. 95, no. 19, 197004, pp. 1-4. https://doi.org/10.1103/PhysRevLett.95.197004en
dc.identifier.doi10.1103/PhysRevLett.95.197004
dc.identifier.issn0031-9007
dc.identifier.issn1079-7114
dc.identifier.otherPURE UUID: b98e4b03-8e14-4dad-85b5-bc7ab115a362
dc.identifier.otherPURE ITEMURL: https://research.aalto.fi/en/publications/b98e4b03-8e14-4dad-85b5-bc7ab115a362
dc.identifier.otherPURE FILEURL: https://research.aalto.fi/files/13438440/PhysRevLett.95.197004.pdf
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/31125
dc.identifier.urnURN:NBN:fi:aalto-201805222565
dc.language.isoenen
dc.publisherAmerican Physical Society
dc.relation.ispartofseriesPhysical Review Lettersen
dc.relation.ispartofseriesVolume 95, issue 19, pp. 1-4en
dc.rightsopenAccessen
dc.titleShot-Noise-Driven Escape in Hysteretic Josephson Junctionsen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.versionpublishedVersion

Files

Original bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
PhysRevLett.95.197004.pdf
Size:
401.4 KB
Format:
Adobe Portable Document Format