Glass Polarization Induced Drift in Microelectromechanical Capacitor
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School of Electrical Engineering |
A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
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en
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4
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Journal of Applied Physics, Volume 111, Number 10
Abstract
We present a quantitative physical model for glass substrate polarization and study the glasspolarization by measuring the capacitance drift from microelectromechanicalcapacitor test structure. The model consists of mobile and immobile charge species, which are related to alkali metals and non-bridging oxygen in glass. The model explains consistently our results and the previously observed non-homogeneous charging effect in a radio-frequency switch fabricated on a glass substrate. The results indicate that the bulk properties of the glass layer itself can be a significant source of drift. The modeling allows estimation of the drift behavior of the several kinds of device structures.Description
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Haarahiltunen, Antti & Varpula, Aapo & Leinvuo, Jouni & Siren, Esko & Rytkönen, Vesa-Pekka & Savin, Hele. 2012. Glass Polarization Induced Drift in Microelectromechanical Capacitor. Journal of Applied Physics. Volume 111, Number 10. 1089-7550 (electronic). DOI: 10.1063/1.4720378