Optimized patterns for digital image correlation

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorBossuyt, Sven
dc.contributor.departmentEnergiatekniikan laitosfi
dc.contributor.departmentDepartment of Energy Technologyen
dc.contributor.schoolInsinööritieteiden korkeakoulufi
dc.contributor.schoolSchool of Engineeringen
dc.date.accessioned2013-11-25T10:00:35Z
dc.date.available2013-11-25T10:00:35Z
dc.date.issued2013
dc.description.abstractThis work presents theoretical background on a novel class of strain sensor patterns. A combination of morphological image processing and Fourier analysis is used to characterize gray-scale images, according to specific criteria, and to synthesize patterns that score particularly well on these criteria. The criteria are designed to evaluate, with a single digital image of a pattern, the suitability of a series of images of that pattern for full-field displacement measurements by digital image correlation (DIC). Firstly, morphological operations are used to flag large featureless areas and to remove from consideration features too small to be resolved. Secondly, the autocorrelation peak sharpness radius en the autocorrelation margin are introduced to quantify the sensitivity and robustness, respectively, expected when using these images in DIC algorithms. For simple patterns these characteristics vary in direct proportion to each other, but it is shown how to synthesize a range of patterns with wide autocorrelation margins even though the autocorrelation peaks are sharp. Such patterns are exceptionally well-suited for DIC measurements.en
dc.description.versionNon Peer reviewed
dc.format.extent9
dc.format.mimetypeapplication/pdf
dc.identifier.citationBossuyt, Sven. 2013. Optimized patterns for digital image correlation. Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics, Volume 3: Imaging Methods for Novel Materials and Challenging Applications,. ISBN 978-1-4614-4235-6 (electronic). ISBN 978-1-4614-4234-9 (printed).en
dc.identifier.isbn978-1-4614-4235-6 (electronic)
dc.identifier.isbn978-1-4614-4234-9 (printed)
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/11453
dc.identifier.urnURN:ISBN:978-1-4614-4235-6
dc.language.isoenen
dc.publisherAalto Universityen
dc.publisherAalto-yliopistofi
dc.relation.ispartofProceedings of the 2012 Annual Conference on Experimental and Applied Mechanics, Volume 3: Imaging Methods for Novel Materials and Challenging Applications,en
dc.rights.holderSpringer
dc.subject.keywordstrain sensoren
dc.subject.keyworddeformation measurementen
dc.subject.keyworddisplacement fielden
dc.subject.otherMechanical engineeringen
dc.titleOptimized patterns for digital image correlationen
dc.typeB3 Vertaisarvioimaton artikkeli konferenssijulkaisussafi
dc.type.dcmitypetexten
dc.type.versionPost print
Files
Original bundle
Now showing 1 - 1 of 1
No Thumbnail Available
Name:
isbn9781461442356.pdf
Size:
2.63 MB
Format:
Adobe Portable Document Format
License bundle
Now showing 1 - 1 of 1
No Thumbnail Available
Name:
licence.txt
Size:
1.22 KB
Format:
Plain Text
Description: