Crack roughness in the two-dimensional random threshold beam model

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© 2008 American Physical Society (APS). This is the accepted version of the following article: Miksic, A. & Alava, Mikko J. 2013. Evolution of grain contacts in a granular sample under creep and stress relaxation. Physical Review E. Volume 88, Issue 3. 032207/1-7. ISSN 1539-3755 (printed). DOI: 10.1103/physreve.88.032207, which has been published in final form at http://journals.aps.org/pre/abstract/10.1103/PhysRevE.78.046105.
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School of Science | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä

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en

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046105/1-8

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Physical Review E, Volume 78, Issue 4

Abstract

We study the scaling of two-dimensional crack roughness using large scale beam lattice systems. Our results indicate that the crack roughness obtained using beam lattice systems does not exhibit anomalous scaling in sharp contrast to the simulation results obtained using scalar fuse lattices. The local and global roughness exponents (ζloc and ζ, respectively) are equal to each other, and the two-dimensional crack roughness exponent is estimated to be ζloc=ζ=0.64±0.02. Removal of overhangs (jumps) in the crack profiles eliminates even the minute differences between the local and global roughness exponents. Furthermore, removing these jumps in the crack profile completely eliminates the multiscaling observed in other studies. We find that the probability density distribution p[Δh(l)] of the height differences Δh(l)=[h(x+l)−h(x)] of the crack profile obtained after removing the jumps in the profiles follows a Gaussian distribution even for small window sizes (l).

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Nukala, Phani K. V. V. & Zapperi, Stefano & Alava, Mikko J. & Simunovic, Srdan. 2008. Crack roughness in the two-dimensional random threshold beam model. Physical Review E. Volume 78, Issue 4. 046105/1-8. ISSN 1539-3755 (printed). DOI: 10.1103/physreve.78.046105.