RF micro-electro-mechanical devices for 0.8-2.5 GHz applications in mobile terminals

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorNieminen, Heikki
dc.contributor.departmentDepartment of Electrical and Communications Engineeringen
dc.contributor.departmentSähkö- ja tietoliikennetekniikan osastofi
dc.contributor.labMetrology Research Instituteen
dc.contributor.labMittaustekniikan laboratoriofi
dc.date.accessioned2012-02-13T13:08:26Z
dc.date.available2012-02-13T13:08:26Z
dc.date.issued2004-12-10
dc.description.abstractThis thesis presents a wide tuning range micro-electro-mechanical (MEM) capacitor. The two-gap MEM capacitor has a measured nominal capacitance of 1.58 pF and achieves a tuning range of 2.25:1 with parasitic capacitance. When all parasitic capacitance to the substrate are extracted the measured nominal capacitance is 1.15 pF and the tuning range is 2.71:1. The device is made of electroplated gold and has a Q of 66 at 1 GHz, and 53 at 2 GHz. In addition, a novel three-state capacitor is presented. Measured capacitance of the first, the second and the third state are 0.86 pF, 1.61 pF and 3.68 pF, respectively. A novel temperature-compensated two-state microelectromechanical (MEM) capacitor is presented. The principle to minimize temperature dependence is based on geometrical compensation and can be extended to other devices such as continuously tunable MEM capacitors. The compensation structure eliminates the effect of intrinsic and thermal stress on the device operation. This leads to a temperature-stable device without compromising the quality factor (Q) or the voltage behavior. The compensation structure increases the robustness of the devices, but does not require any modifications to the process. Measurement results verify that the OFF and ON capacitance change is less than 6 % and the pull-in voltage is less than 5 % when the temperature is varied from −30 °C to +70 °C. In addition to the temperature stability, the charging of the dielectric layer is studied and a new continuous reliability measurement set-up is presented. This thesis describes important design principles of electrostatically actuated MEM capacitors. Key design principles, such as temperature compensation, calculation of mechanical properties, and calculation of electrical properties of MEM capacitor are studied in detail. A new design principle that describes how pull-in and release voltage ratio is only dependent on up and down capacitance ratio and not on the mechanical properties such as a spring constant is also derived. In addition, it is shown how the RF signal affects the voltage behavior of the MEM capacitor. Two-state, three-state and continuously tunable MEM capacitors are designed and fabricated using presented design principles. Modeling, fabrication and analysis of a truly three-dimensional high-quality-factor toroidal inductor using polymer replication processes is presented. The critical dimensions are in the micrometer range, and the applied manufacturing method is based on the polymer replication. Electrical measurements show that the inductor with an inductance of 6.0 nH exhibits a Q of 37 at 1 GHz and a peak quality factor of 50 at a frequency of 3 GHz. Furthermore, the applied manufacturing technique can be extended to become a flexible packaging platform.en
dc.description.versionrevieweden
dc.format.extent64, [39]
dc.format.mimetypeapplication/pdf
dc.identifier.isbn951-22-7353-5
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/2491
dc.identifier.urnurn:nbn:fi:tkk-004549
dc.language.isoenen
dc.publisherHelsinki University of Technologyen
dc.publisherTeknillinen korkeakoulufi
dc.relation.haspartNieminen H., Ermolov V., and Ryhänen T., 2001. Microelectromechanical capacitor with wide tuning range. Electronics Letters 37, number 24, pages 1451-1452. [article1.pdf] © 2001 IEE. By permission.
dc.relation.haspartNieminen H., Ermolov V., Nybergh K., Silanto S., and Ryhänen T., 2002. Microelectromechanical capacitors for RF applications. Journal of Micromechanics and Microengineering 12, number 2, pages 177-186. [article2.pdf] © 2002 Institute of Physics Publishing Ltd. By permission.
dc.relation.haspartErmolov V., Lindström T., Nieminen H., Olsson M., Read M., Ryhänen T., Silanto S., and Uhrberg S., 2004. Microreplicated RF toroidal inductor. IEEE Transactions on Microwave Theory and Techniques 52, number 1, pages 29-37. [article3.pdf] © 2004 IEEE. By permission.
dc.relation.haspartNieminen H., Ermolov V., Silanto S., Nybergh K., and Ryhänen T., 2004. Design of a temperature-stable RF MEM capacitor. Journal of Microelectromechanical Systems 13, number 5, pages 705-714. [article4.pdf] © 2004 IEEE. By permission.
dc.relation.haspartNieminen H., Hyyryläinen J., Veijola T., Ryhänen T., and Ermolov V., 2005. Transient capacitance measurement of MEM capacitor. Sensors and Actuators A 117, number 2, pages 267-272.
dc.subject.keywordRF MEMSen
dc.subject.keywordmicro-electro-mechanical capacitoren
dc.subject.keywordmicro-replicated RF toroidal inductoren
dc.subject.otherElectrical engineeringen
dc.titleRF micro-electro-mechanical devices for 0.8-2.5 GHz applications in mobile terminalsen
dc.typeG5 Artikkeliväitöskirjafi
dc.type.dcmitypetexten
dc.type.ontasotVäitöskirja (artikkeli)fi
dc.type.ontasotDoctoral dissertation (article-based)en
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