The Automatization of Positron Measurements and Application to Defects in Heavily Doped Silicon

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Helsinki University of Technology | Diplomityö
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Date
2000
Major/Subject
Fysiikka
Mcode
Tfy-3
Degree programme
Language
fi
Pages
98
Series
Description
Supervisor
Hautojärvi, Pekka
Keywords
positronispektropia, Si, kompensaatio, vakanssivirhe, positron spectroscopy, compensation, vacancy defect
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