Demonstration of electron focusing using electronic lenses in low-dimensional system

dc.contributorAalto Universityen
dc.contributor.authorYan, Chengyuen_US
dc.contributor.authorPepper, Michaelen_US
dc.contributor.authorSee, Patricken_US
dc.contributor.authorFarrer, Ianen_US
dc.contributor.authorRitchie, Daviden_US
dc.contributor.authorGriffiths, Jonathanen_US
dc.contributor.departmentDepartment of Applied Physicsen_US
dc.contributor.departmentUniversity College Londonen_US
dc.contributor.departmentNational Physical Laboratory (NPL)en_US
dc.contributor.departmentUniversity of Sheffielden_US
dc.contributor.departmentUniversity of Cambridgeen_US
dc.description.abstractWe report an all-electric integrable electron focusing lens in n-type GaAs. It is shown that a pronounced focusing peak takes place when the focal point aligns with an on-chip detector. The intensity and full width half maximum (FWHM) of the focusing peak are associated with the collimation of injected electrons. To demonstrate the reported focusing lens can be a useful tool, we investigate the characteristic of an asymmetrically gate biased quantum point contact with the assistance of a focusing lens. A correlation between the occurrence of conductance anomaly in low conductance regime and increase in FWHM of focusing peak is observed. The correlation is likely due to the electron-electron interaction. The reported electron focusing lens is essential for a more advanced electron optics device.en
dc.description.versionPeer revieweden
dc.identifier.citationYan , C , Pepper , M , See , P , Farrer , I , Ritchie , D & Griffiths , J 2020 , ' Demonstration of electron focusing using electronic lenses in low-dimensional system ' , Scientific Reports , vol. 10 , no. 1 , 2593 .
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dc.publisherNature Publishing Group
dc.relation.ispartofseriesScientific Reportsen
dc.relation.ispartofseriesVolume 10, issue 1en
dc.titleDemonstration of electron focusing using electronic lenses in low-dimensional systemen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi