Calculated properties of point defects in Be-doped GaN

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorLatham, C. D.
dc.contributor.authorNieminen, Risto M.
dc.contributor.authorFall, C. J.
dc.contributor.authorJones, R.
dc.contributor.authorÖberg, S.
dc.contributor.authorBriddon, P. R.
dc.contributor.departmentTeknillisen fysiikan laitosfi
dc.contributor.departmentDepartment of Applied Physicsen
dc.contributor.schoolPerustieteiden korkeakoulufi
dc.contributor.schoolSchool of Scienceen
dc.date.accessioned2015-07-30T09:02:07Z
dc.date.available2015-07-30T09:02:07Z
dc.date.issued2003
dc.description.abstractThe properties of several point defects in hexagonal gallium nitride that can compensate beryllium shallow acceptors (BeGa) are calculated using the AIMPRO method based on local density functional theory. BeGa itself is predicted to have local vibrational modes (LVM’s) very similar to magnesium acceptors. The highest frequency is about 663cm−1. Consistent with other recent studies, we find that interstitial beryllium double donors and single-donor beryllium split interstitial pairs at gallium sites are very likely causes of compensation. The calculations predict that the split interstitial pairs possess three main LVM’s at about 1041, 789, and 738cm−1. Of these, the highest is very close to the experimental observation in Be-doped GaN. Although an oxygen donor at the nearest-neighboring site to a beryllium acceptor (BeGa−ON) is also a prime suspect among defects that are possibly responsible for compensation, its highest frequency is calculated to be about 699cm−1 and hence is not related in any way to the observed center. Another mode for this defect is estimated to be about 523cm−1 and is localized on the ON atom. These two vibrations of BeGa−ON are thus equivalent to those for the isolated substitutional centers perturbed by the presence of their impurity partners.en
dc.description.versionPeer revieweden
dc.format.extent205206/1-8
dc.format.mimetypeapplication/pdfen
dc.identifier.citationLatham, C. D. & Nieminen, Risto M. & Fall, C. J. & Jones, R. & Öberg, S. & Briddon, P. R. 2003. Calculated properties of point defects in Be-doped GaN. Physical Review B. Volume 67, Issue 20. 205206/1-8. ISSN 1550-235X (electronic). DOI: 10.1103/physrevb.67.205206.en
dc.identifier.doi10.1103/physrevb.67.205206
dc.identifier.issn1550-235X (electronic)
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/17320
dc.identifier.urnURN:NBN:fi:aalto-201507303950
dc.language.isoenen
dc.publisherAmerican Physical Society (APS)en
dc.relation.ispartofseriesPhysical Review Ben
dc.relation.ispartofseriesVolume 67, Issue 20
dc.rights© 2003 American Physical Society (APS). This is the accepted version of the following article: Latham, C. D. & Nieminen, Risto M. & Fall, C. J. & Jones, R. & Öberg, S. & Briddon, P. R. 2003. Calculated properties of point defects in Be-doped GaN. Physical Review B. Volume 67, Issue 20. 205206/1-8. ISSN 1550-235X (electronic). DOI: 10.1103/physrevb.67.205206, which has been published in final form at http://journals.aps.org/prb/abstract/10.1103/PhysRevB.67.205206.en
dc.rights.holderAmerican Physical Society (APS)
dc.subject.keywordhexagonal gallium nitrideen
dc.subject.keywordberyllium shallow acceptorsen
dc.subject.otherPhysicsen
dc.titleCalculated properties of point defects in Be-doped GaNen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.dcmitypetexten
dc.type.versionFinal published versionen

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