Atomic and Molecular Layer Deposition of Functional Thin Films Based on Rare Earth Elements

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A2 Katsausartikkeli tieteellisessä aikakauslehdessä

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en

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30

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Advanced Materials Interfaces, Volume 12, issue 4

Abstract

High-quality rare earth element (R) based thin films are in demand for applications ranging from (opto)electronics and energy conversion/storage to medical diagnostics, imaging and security technologies. Atomic layer deposition (ALD) offers large-area homogeneous and conformal ultrathin films and is uniquely suited to address the requirements set by the potential applications of R-based thin films. The history starts from the 1990s, when the first electroluminescent R-doped thin films were grown with ALD. The interest soon expanded to rare earth element oxide layers as high-k gate dielectrics in semiconductor devices, and later to complex ternary and quaternary perovskite oxides with novel functional properties. The most recent advancements related to the combined atomic/molecular layer deposition (ALD/MLD) have rapidly expanded the family of R-organic hybrid materials with intriguing luminescence and up-conversion properties. This review provides up-to-date insights to the current state of ALD and ALD/MLD research of R-based thin films and highlights their application potential.

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| openaire: EC/HE/101097815/EU//UniEn-MLD

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Ghazy, A, Zanders, D, Devi, A & Karppinen, M 2025, 'Atomic and Molecular Layer Deposition of Functional Thin Films Based on Rare Earth Elements', Advanced Materials Interfaces, vol. 12, no. 4, 2400274. https://doi.org/10.1002/admi.202400274