Series reversion for electrical impedance tomography with modeling errors

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorGarde, H.en_US
dc.contributor.authorHyvönen, N.en_US
dc.contributor.authorKuutela, T.en_US
dc.contributor.departmentDepartment of Mathematics and Systems Analysisen
dc.contributor.groupauthorNumerical Analysisen
dc.date.accessioned2023-09-06T06:03:36Z
dc.date.available2023-09-06T06:03:36Z
dc.date.issued2023-08en_US
dc.descriptionFunding Information: The work of N H and T K was supported by the Academy of Finland (decision 336789) and Jane and Aatos Erkko Foundation via the project Electrical impedance tomography—a novel method for improved diagnostics of stroke. Publisher Copyright: © 2023 The Author(s). Published by IOP Publishing Ltd.
dc.description.abstractThis work extends the results of Garde and Hyvönen (2022 Math. Comput. 91 1925-1953) on series reversion for Calderón's problem to the case of realistic electrode measurements, with both the internal admittivity of the investigated body and the contact admittivity at the electrode-object interfaces treated as unknowns. The forward operator, sending the internal and contact admittivities to the linear electrode current-to-potential map, is first proven to be analytic. A reversion of the corresponding Taylor series yields a family of numerical methods of different orders for solving the inverse problem of electrical impedance tomography, with the possibility to employ different parametrizations for the unknown internal and boundary admittivities. The functionality and convergence of the methods is established only if the employed finite-dimensional parametrization of the unknowns allows the Fréchet derivative of the forward map to be injective, but we also heuristically extend the methods to more general settings by resorting to regularization motivated by Bayesian inversion. The performance of this regularized approach is tested via three-dimensional numerical examples based on simulated data. The effect of modeling errors related to electrode shapes and contact admittances is a focal point of the numerical studies.en
dc.description.versionPeer revieweden
dc.format.extent28
dc.format.mimetypeapplication/pdfen_US
dc.identifier.citationGarde, H, Hyvönen, N & Kuutela, T 2023, 'Series reversion for electrical impedance tomography with modeling errors', Inverse Problems, vol. 39, no. 8, 085007, pp. 1-28. https://doi.org/10.1088/1361-6420/acdab8en
dc.identifier.doi10.1088/1361-6420/acdab8en_US
dc.identifier.issn0266-5611
dc.identifier.issn1361-6420
dc.identifier.otherPURE UUID: c1d20e43-500d-4f6b-a944-561284769b48en_US
dc.identifier.otherPURE ITEMURL: https://research.aalto.fi/en/publications/c1d20e43-500d-4f6b-a944-561284769b48en_US
dc.identifier.otherPURE FILEURL: https://research.aalto.fi/files/120030300/Series_reversion_for_electrical_impedance_tomography_with_modeling_errors.pdf
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/123347
dc.identifier.urnURN:NBN:fi:aalto-202309065712
dc.language.isoenen
dc.publisherInstitute of Physics Publishing
dc.relation.fundinginfoThe work of N H and T K was supported by the Academy of Finland (decision 336789) and Jane and Aatos Erkko Foundation via the project Electrical impedance tomography—a novel method for improved diagnostics of stroke.
dc.relation.ispartofseriesInverse Problemsen
dc.relation.ispartofseriesVolume 39, issue 8, pp. 1-28en
dc.rightsopenAccessen
dc.subject.keywordBayesian inversionen_US
dc.subject.keywordelectrical impedance tomographyen_US
dc.subject.keywordLevenberg-Marquardt algorithmen_US
dc.subject.keywordmismodelingen_US
dc.subject.keywordseries reversionen_US
dc.subject.keywordsmoothened complete electrode modelen_US
dc.titleSeries reversion for electrical impedance tomography with modeling errorsen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.versionpublishedVersion

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