Simulating Atomic Force Microscopy with Functionalized Tips

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.advisorFoster, Adam
dc.contributor.authorKeisanen, Olli
dc.contributor.schoolPerustieteiden korkeakoulufi
dc.contributor.supervisorAlava, Mikko
dc.date.accessioned2015-12-22T10:39:58Z
dc.date.available2015-12-22T10:39:58Z
dc.date.issued2015-12-17
dc.format.extent25
dc.format.mimetypeapplication/pdfen
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/19338
dc.identifier.urnURN:NBN:fi:aalto-201512235849
dc.language.isoenen
dc.programmeTeknistieteellinen kandidaattiohjelmafi
dc.programme.majorTeknillinen fysiikkafi
dc.programme.mcodeSCI3028fi
dc.subject.keywordatomic force microscopyen
dc.subject.keywordsimulationen
dc.subject.keywordmechanical AFMen
dc.subject.keywordfunctionalized tipen
dc.subject.keywordNC-AFMen
dc.titleSimulating Atomic Force Microscopy with Functionalized Tipsen
dc.typeG1 Kandidaatintyöfi
dc.type.dcmitypetexten
dc.type.ontasotBachelor's thesisen
dc.type.ontasotKandidaatintyöfi
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