(oral talk) Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact

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dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorLaine, Hannu S.en_US
dc.contributor.authorVahlman, Henrien_US
dc.contributor.authorHaarahiltunen, Anttien_US
dc.contributor.authorJensen, Mallory A.en_US
dc.contributor.authorModanese, Chiaraen_US
dc.contributor.authorWagner, Matthiasen_US
dc.contributor.authorWolny, Franziskaen_US
dc.contributor.authorBuonassisi, Tonioen_US
dc.contributor.authorSavin, Heleen_US
dc.contributor.departmentDepartment of Electronics and Nanoengineeringen
dc.contributor.groupauthorHele Savin Groupen
dc.contributor.organizationMassachusetts Institute of Technologyen_US
dc.contributor.organizationSolarWorld Industries GmbHen_US
dc.date.accessioned2022-03-28T09:40:30Z
dc.date.available2022-03-28T09:40:30Z
dc.date.issued2018en_US
dc.description| openaire: EC/FP7/307315/EU//SOLARX
dc.description.versionPeer revieweden
dc.identifier.citationLaine, H S, Vahlman, H, Haarahiltunen, A, Jensen, M A, Modanese, C, Wagner, M, Wolny, F, Buonassisi, T & Savin, H 2018, ' (oral talk) Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact ', International Conference on Crystalline Silicon Photovoltaics, Lausanne, Switzerland, 18/03/2018 - 21/03/2018 .en
dc.identifier.otherPURE UUID: 2c913aab-423a-4b88-a829-27deba154b66en_US
dc.identifier.otherPURE ITEMURL: https://research.aalto.fi/en/publications/2c913aab-423a-4b88-a829-27deba154b66en_US
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/113746
dc.identifier.urnURN:NBN:fi:aalto-202203282623
dc.language.isoenen
dc.relationinfo:eu-repo/grantAgreement/EC/FP7/307315/EU//SOLARXen_US
dc.relation.ispartofInternational Conference on Crystalline Silicon Photovoltaicsen
dc.rightsrestrictedAccessen
dc.title(oral talk) Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impacten
dc.typeAbstractfi
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