(oral talk) Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact
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2018
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en
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| openaire: EC/FP7/307315/EU//SOLARX
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Laine, H S, Vahlman, H, Haarahiltunen, A, Jensen, M A, Modanese, C, Wagner, M, Wolny, F, Buonassisi, T & Savin, H 2018, ' (oral talk) Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact ', International Conference on Crystalline Silicon Photovoltaics, Lausanne, Switzerland, 18/03/2018 - 21/03/2018 .
