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Using multiple re-embeddings for quantitative steganalysis and image reliability estimation

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dc.contributor Aalto-yliopisto fi
dc.contributor Aalto University en
dc.contributor.author Miche, Yoan
dc.contributor.author Bas, Patrick
dc.contributor.author Lendasse, Amaury
dc.date.accessioned 2011-11-28T13:26:46Z
dc.date.available 2011-11-28T13:26:46Z
dc.date.issued 2010
dc.identifier.isbn 978-952-60-3250-4
dc.identifier.issn 1797-5042
dc.identifier.uri https://aaltodoc.aalto.fi/handle/123456789/912
dc.description.abstract The quantitative steganalysis problem aims at estimating the amount of payload embedded inside a document. In this paper, JPEG images are considered, and by the use of a re-embedding based methodology, it is possible to estimate the number of original embedding changes performed on the image by a stego source and to slightly improve the estimation regarding classical quantitative steganalysis methods. The major advance of this methodology is that it also enables to obtain a confidence interval on this estimated payload. This confidence interval then permits to evaluate the difficulty of an image, in terms of steganalysis by estimating the reliability of the output. The regression technique comes from the OP-ELM and the reliability is estimated using linear approximation. The methodology is applied with a publicly available stego algorithm, regression model and database of images. The methodology is generic and can be used for any quantitative steganalysis problem of this class. en
dc.format.extent 19
dc.format.mimetype application/pdf
dc.language.iso en en
dc.publisher Aalto University School of Science and Technology en
dc.publisher Aalto-yliopiston teknillinen korkeakoulu fi
dc.relation.ispartofseries TKK reports in information and computer science en
dc.relation.ispartofseries 34 en
dc.subject.other Computer science en
dc.title Using multiple re-embeddings for quantitative steganalysis and image reliability estimation en
dc.contributor.school Faculty of Information and Natural Sciences en
dc.contributor.school Informaatio- ja luonnontieteiden tiedekunta fi
dc.contributor.department Department of Information and Computer Science en
dc.contributor.department Tietojenkäsittelytieteen laitos fi
dc.subject.keyword steganography en
dc.subject.keyword steganalysis en
dc.subject.keyword OP-ELM en
dc.subject.keyword quantitative steganalysis en
dc.subject.keyword re-embedding en
dc.subject.keyword inner image difficulty en
dc.identifier.urn urn:nbn:fi:tkk-013174
dc.type.dcmitype text en


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