The Automatization of Positron Measurements and Application to Defects in Heavily Doped Silicon



Title:	The Automatization of Positron Measurements and Application to Defects in Heavily Doped Silicon Positronimittausten automatisointi ja soveltaminen voimakkaasti n-tyyppisen piin hilavirheisiin
Author(s):	Ranki, Ville
Date:	2000
Language:	fi
Pages:	98
Department:	Teknillisen fysiikan ja matematiikan osasto
Major/Subject:	Fysiikka
Supervising professor(s):	Hautojärvi, Pekka
Keywords:	positronispektropia, Si, kompensaatio, vakanssivirhe, positron spectroscopy, compensation, vacancy defect
Location:	Archive
	OEVS yes
Digitized thesis:	ask
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Permanent link to this item: http://urn.fi/URN:NBN:fi:aalto-2020120447183 Email this Export to RefWorks QR Code Print BibTex Tweet