Toward Intelligent Industrial Informatics

De Silva, Daswin; Sierla, Seppo; Alahakoon, Damminda; Osipov, Evgeny; Yu, Xinghuo; Vyatkin, Valeriy

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Toward Intelligent Industrial Informatics

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Title:	Toward Intelligent Industrial Informatics
Author(s):	De Silva, Daswin ; Sierla, Seppo ; Alahakoon, Damminda ; Osipov, Evgeny ; Yu, Xinghuo ; Vyatkin, Valeriy
Date:	2020-06
Language:	en
Pages:	16 57-72
Department:	La Trobe University Information Technologies in Industrial Automation Luleå University of Technology Royal Melbourne Institute of Technology University Department of Electrical Engineering and Automation
Series:	IEEE INDUSTRIAL ELECTRONICS MAGAZINE, Volume 14, issue 2
ISSN:	1932-4529
DOI-number:	10.1109/MIE.2019.2952165
Keywords:	Informatics, Deep Learning, Cognition, Data mining, Feature extraction, Artificial Intelligence
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Citation: De Silva , D , Sierla , S , Alahakoon , D , Osipov , E , Yu , X & Vyatkin , V 2020 , ' Toward Intelligent Industrial Informatics : A Review of Current Developments and Future Directions of Artificial Intelligence in Industrial Applications ' , IEEE INDUSTRIAL ELECTRONICS MAGAZINE , vol. 14 , no. 2 , 9127167 , pp. 57-72 . https://doi.org/10.1109/MIE.2019.2952165
Abstract: Research, the universal pursuit of new knowledge, is embarking on a fresh journey into artificial intelligence (AI). Nature reports that AI arose nine places to the fourth-most popular search term and that search terms "machine learning" and "deep learning" appeared in the top 20 for the first time since 2018. It is pertinent for industrial informatics to embrace this renewed surge of interest in AI with a clear direction and purpose that engages scholars, practitioners, and professionals alike.

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