Citation:
Toosi , T , Sirola , M , Laukkanen , J , Heeswijk , M V & Karhunen , J 2019 , ' METHOD FOR DETECTING AGING RELATED FAILURES OF PROCESS SENSORS VIA NOISE SIGNAL MEASUREMENT ' , International Scientific Journal of Computing , vol. 18 , no. 2 , pp. 135-146 . < http://www.computingonline.net/computing/article/view/1412 >
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