Citation:
Krutkin , O L , Altukhov , A B , Gurchenko , A D , Gusakov , E Z , Heuraux , S , Irzak , M A , Esipov , L A , Kiviniemi , T P , Lechte , C , Leerink , S , Niskala , P & Zadvitskiy , G 2020 , ' Investigation of nonlinear effects in Doppler reflectometry using full-wave synthetic diagnostics ' , Plasma Science and Technology , vol. 22 , no. 6 , 064001 . https://doi.org/10.1088/2058-6272/ab5c28
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