Computed Atomic Force Microscopy Images of Chromosomes by Calculating Forces with Oscillating Probes

 |  Login

Show simple item record

dc.contributor Aalto-yliopisto fi
dc.contributor Aalto University en Sumikama, Takashi Foster, Adam S. Fukuma, Takeshi 2020-02-21T08:05:24Z 2020-02-21T08:05:24Z 2020-01-01
dc.identifier.citation Sumikama , T , Foster , A S & Fukuma , T 2020 , ' Computed Atomic Force Microscopy Images of Chromosomes by Calculating Forces with Oscillating Probes ' , Journal of Physical Chemistry C . en
dc.identifier.issn 1932-7447
dc.identifier.issn 1932-7455
dc.identifier.other PURE UUID: bbfdffe3-344b-485d-96f9-97e61778cb2a
dc.identifier.other PURE ITEMURL:
dc.identifier.other PURE LINK:
dc.identifier.other PURE FILEURL:
dc.description.abstract Atomic force microscopy (AFM) is a promising tool to visualize biomolecules at the sub-nanometer scale. Experimentally obtained AFM images have been compared with the simulated ones; however, such conventional images of biomolecules were usually computed by calculating equidistance surface from given atomic positions, not by calculating force. Here, we use a polymer model of a chromosome, as a representative biomolecule, and the AFM probe, and computed isoforce surfaces upon the fiber. The oscillation of probes utilized in the dynamic mode of AFM measurements was also implemented in the simulation. The computed isoforce images were clearer than the conventional equidistance ones, and a very similar images to isoforce ones were obtained when the diameter of the probe was reduced to approximately 30% in the equidistance images. Thus, the probe was found to approach very close to samples beyond the estimation of the equidistance surface, contributing clear AFM images. en
dc.format.mimetype application/pdf
dc.language.iso en en
dc.relation.ispartofseries Journal of Physical Chemistry C en
dc.rights openAccess en
dc.subject.other Electronic, Optical and Magnetic Materials en
dc.subject.other Energy(all) en
dc.subject.other Physical and Theoretical Chemistry en
dc.subject.other Surfaces, Coatings and Films en
dc.subject.other 114 Physical sciences en
dc.title Computed Atomic Force Microscopy Images of Chromosomes by Calculating Forces with Oscillating Probes en
dc.type A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä fi
dc.description.version Peer reviewed en
dc.contributor.department Kanazawa University
dc.contributor.department Surfaces and Interfaces at the Nanoscale
dc.contributor.department Department of Applied Physics en
dc.subject.keyword Electronic, Optical and Magnetic Materials
dc.subject.keyword Energy(all)
dc.subject.keyword Physical and Theoretical Chemistry
dc.subject.keyword Surfaces, Coatings and Films
dc.subject.keyword 114 Physical sciences
dc.identifier.urn URN:NBN:fi:aalto-202002212266
dc.identifier.doi 10.1021/acs.jpcc.9b10263
dc.type.version publishedVersion

Files in this item

Files Size Format View

There are no open access files associated with this item.

This item appears in the following Collection(s)

Show simple item record

Search archive

Advanced Search

article-iconSubmit a publication